X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion Hanging Drop
pH 8
Temperature 298.0
Details 12% PEG3350, 0.1 M Tris-HCl, 0.25 M magnesium chloride, pH 8, VAPOR DIFFUSION, HANGING DROP, temperature 298K

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 227.04 α = 90
b = 49.32 β = 94.82
c = 92.89 γ = 90
Symmetry
Space Group C 1 2 1

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 298
Diffraction Detector
Detector Diffraction Type Details Collection Date
CCD MARMOSAIC 300 mm CCD -- 2012-11-26
Diffraction Radiation
Monochromator Protocol
Rosenbaum-Rock double-crystal Si(111) SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 22-ID 1.00 APS 22-ID

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.56 20.05 94.82 0.088 -- -- 3.8 31904 31904 2.0 2.0 --
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
2.5568 2.64 83.3 0.438 -- 2.0 2.9 --

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
MOLECULAR REPLACEMENT 2.557 20.047 -- 1.35 31815 31816 1625 94.56 -- 0.2309 0.2289 0.2663 --
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 2.557 2.6319 -- 111 2087 0.3755 0.4264 -- 80.0
X Ray Diffraction 2.6319 2.7166 -- 106 2277 0.3542 0.3374 -- 86.0
X Ray Diffraction 2.7166 2.8135 -- 128 2340 0.3484 0.4641 -- 89.0
X Ray Diffraction 2.8135 2.9258 -- 135 2466 0.3311 0.3736 -- 93.0
X Ray Diffraction 2.9258 3.0585 -- 142 2516 0.2868 0.3066 -- 96.0
X Ray Diffraction 3.0585 3.2191 -- 119 2613 0.3047 0.3956 -- 98.0
X Ray Diffraction 3.2191 3.4199 -- 135 2603 0.268 0.3386 -- 98.0
X Ray Diffraction 3.4199 3.6824 -- 148 2616 0.2416 0.2878 -- 99.0
X Ray Diffraction 3.6824 4.0502 -- 143 2644 0.2236 0.2338 -- 99.0
X Ray Diffraction 4.0502 4.63 -- 153 2619 0.1902 0.2445 -- 99.0
X Ray Diffraction 4.63 5.8097 -- 155 2667 0.1857 0.2195 -- 99.0
X Ray Diffraction 5.8097 20.0473 -- 150 2743 0.1852 0.2179 -- 99.0
RMS Deviations
Key Refinement Restraint Deviation
f_angle_d 1.151
f_plane_restr 0.005
f_chiral_restr 0.075
f_bond_d 0.009
f_dihedral_angle_d 16.591
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 6603
Nucleic Acid Atoms 0
Heterogen Atoms 0
Solvent Atoms 12

Software

Software
Software Name Purpose
HKL-2000 data collection
PHENIX model building
PHENIX refinement version: (phenix.refine: 1.8.2_1309)
HKL-2000 data reduction
HKL-2000 data scaling
PHENIX phasing