X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion Sitting Drop
pH 7
Temperature 289.0
Details 0.01M sodium citrate, 33% (w/v) PEG6000, pH 7.0, VAPOR DIFFUSION, SITTING DROP, temperature 289K

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 71.27 α = 90
b = 78.45 β = 90
c = 49.71 γ = 90
Symmetry
Space Group P 21 21 2

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 100
Diffraction Detector
Detector Diffraction Type Details Collection Date
CCD ADSC QUANTUM 315r mirror 2013-01-31
Diffraction Radiation
Monochromator Protocol
Si 111 crystal SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 19-ID 0.97926 APS 19-ID

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.72 27.5 99.5 0.077 -- -- 5.9 30087 30087 0.0 -5.0 --
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1.72 1.75 100.0 0.636 -- 3.4 6.1 1476

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
SAD 1.722 27.17 -- 1.35 30042 30042 1518 99.41 -- 0.1798 0.1782 0.2093 random
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 1.7215 1.7771 -- 141 2535 0.2337 0.3146 -- 99.0
X Ray Diffraction 1.7771 1.8406 -- 116 2565 0.2155 0.2444 -- 100.0
X Ray Diffraction 1.8406 1.9143 -- 141 2591 0.1997 0.2568 -- 100.0
X Ray Diffraction 1.9143 2.0014 -- 144 2527 0.202 0.2657 -- 100.0
X Ray Diffraction 2.0014 2.1069 -- 154 2573 0.1999 0.2588 -- 100.0
X Ray Diffraction 2.1069 2.2388 -- 136 2587 0.198 0.2673 -- 100.0
X Ray Diffraction 2.2388 2.4116 -- 127 2596 0.1885 0.2339 -- 100.0
X Ray Diffraction 2.4116 2.6541 -- 144 2623 0.196 0.2282 -- 100.0
X Ray Diffraction 2.6541 3.0377 -- 132 2615 0.2024 0.2443 -- 100.0
X Ray Diffraction 3.0377 3.8254 -- 138 2632 0.1709 0.2116 -- 99.0
X Ray Diffraction 3.8254 27.1732 -- 145 2680 0.1522 0.1574 -- 97.0
RMS Deviations
Key Refinement Restraint Deviation
f_angle_d 1.008
f_dihedral_angle_d 13.599
f_bond_d 0.006
f_chiral_restr 0.072
f_plane_restr 0.004
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 2311
Nucleic Acid Atoms 0
Heterogen Atoms 12
Solvent Atoms 162

Software

Software
Software Name Purpose
SBC-Collect data collection
SHELXD phasing
MLPHARE phasing
DM model building
ARP model building
WARP model building
HKL-3000 phasing
PHENIX refinement version: (phenix.refine: 1.8.1_1168)
HKL-3000 data reduction
HKL-3000 data scaling
DM phasing