X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion Sitting Drop
pH 6.5
Temperature 293.0
Details 18% PEG3000, 0.2 M ammonium acetate, 0.1 M MES, pH 6.5, cryoprotectant: 20% PEG3000, 0.16 M ammonium acetate, 0.1 M MES, PH 6.5, 24% glycerol, VAPOR DIFFUSION, SITTING DROP, temperature 293K

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 93.45 α = 90
b = 60.56 β = 99.66
c = 72.14 γ = 90
Symmetry
Space Group C 1 2 1

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 95
Diffraction Detector
Detector Diffraction Type Details Collection Date
CCD RIGAKU SATURN 944 VARIMAX HF 2008-11-04
Diffraction Radiation
Monochromator Protocol
-- SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
ROTATING ANODE RIGAKU MICROMAX-007 HF 1.5418 -- --

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.92 30 91.7 0.035 -- -- 4.9 28013 28013 0.0 -3.0 27.2
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1.92 1.97 55.0 0.15 -- 6.6 2.7 --

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
MOLECULAR REPLACEMENT 1.92 15.0 -- 0.0 26958 26958 997 91.7 0.17251 0.17251 0.17063 0.22523 RANDOM
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 1.92 1.968 -- 38 1164 0.211 0.294 -- 55.0
Temperature Factor Modeling
Temperature Factor Value
Mean Isotropic B 27.0
Anisotropic B[1][1] 0.45
Anisotropic B[1][2] 0.0
Anisotropic B[1][3] 0.36
Anisotropic B[2][2] -0.35
Anisotropic B[2][3] 0.0
Anisotropic B[3][3] 0.02
RMS Deviations
Key Refinement Restraint Deviation
r_scangle_it 18.54
r_chiral_restr 0.064
r_mcbond_it 1.239
r_bond_refined_d 0.006
r_dihedral_angle_1_deg 5.698
r_angle_refined_deg 1.034
r_dihedral_angle_3_deg 12.672
r_scbond_it 15.413
r_dihedral_angle_2_deg 32.798
r_mcangle_it 2.528
r_dihedral_angle_4_deg 15.365
r_gen_planes_refined 0.004
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 3238
Nucleic Acid Atoms 0
Heterogen Atoms 34
Solvent Atoms 339

Software

Software
Software Name Purpose
CrystalClear data collection
PHASER phasing version: SEARCH MODEL: 1RZ7 (VL)
2CMR model building version: (VH)
REFMAC refinement version: 5.5.0109
XDS data reduction
XDS data scaling
2CMR phasing version: (VH)