X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion Hanging Drop
pH 8.5
Temperature 292.0
Details 0.1M Tris pH 8.5, 12% PEG 4000, 0.1M NaCl, 0.2M MgCl2, VAPOR DIFFUSION, HANGING DROP, temperature 292K
Method Vapor Diffusion Hanging Drop
pH 9
Temperature 292.0
Details 0.1M BisTris-propane pH 9.0, 14% PEG 4000, 0.1M NaCl, 0.15M MgCl2', VAPOR DIFFUSION, HANGING DROP, temperature 292K

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 94.73 α = 90
b = 124.14 β = 90
c = 71.89 γ = 90
Symmetry
Space Group P 21 21 2

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 100
2 100
Diffraction Detector
Detector Diffraction Type Details Collection Date
PIXEL PSI PILATUS 6M -- 2012-09-12
PIXEL PSI PILATUS 6M -- 2012-10-14
Diffraction Radiation
Monochromator Protocol
-- SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON SOLEIL BEAMLINE PROXIMA 1 0.979180 SOLEIL PROXIMA 1
SYNCHROTRON SOLEIL BEAMLINE PROXIMA 1 0.980110 SOLEIL PROXIMA 1

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2 46.98 99.5 0.0666 -- -- 5.2 -- 58014 -- 3.0 35.15

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
SAD then MR 2.0 46.98 -- 2.0 58014 57894 2894 99.85 -- 0.1643 0.1625 0.1981 RANDOM
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 2.0 2.0328 -- 133 2540 0.2493 0.2997 -- 99.0
X Ray Diffraction 2.0328 2.0678 -- 136 2589 0.2275 0.2705 -- 100.0
X Ray Diffraction 2.0678 2.1054 -- 136 2583 0.211 0.2522 -- 100.0
X Ray Diffraction 2.1054 2.1459 -- 137 2595 0.2014 0.2677 -- 100.0
X Ray Diffraction 2.1459 2.1897 -- 135 2567 0.1888 0.2437 -- 100.0
X Ray Diffraction 2.1897 2.2374 -- 138 2623 0.1865 0.2111 -- 100.0
X Ray Diffraction 2.2374 2.2894 -- 136 2590 0.1848 0.2382 -- 100.0
X Ray Diffraction 2.2894 2.3467 -- 136 2570 0.1738 0.2528 -- 100.0
X Ray Diffraction 2.3467 2.4101 -- 137 2607 0.1748 0.1992 -- 100.0
X Ray Diffraction 2.4101 2.481 -- 138 2622 0.1674 0.1991 -- 100.0
X Ray Diffraction 2.481 2.5611 -- 137 2599 0.1736 0.2367 -- 100.0
X Ray Diffraction 2.5611 2.6526 -- 137 2607 0.1738 0.2249 -- 100.0
X Ray Diffraction 2.6526 2.7588 -- 137 2600 0.1714 0.2177 -- 100.0
X Ray Diffraction 2.7588 2.8844 -- 138 2616 0.1706 0.2099 -- 100.0
X Ray Diffraction 2.8844 3.0364 -- 137 2610 0.1665 0.2064 -- 100.0
X Ray Diffraction 3.0364 3.2266 -- 138 2625 0.1552 0.1788 -- 100.0
X Ray Diffraction 3.2266 3.4756 -- 139 2637 0.1498 0.1787 -- 100.0
X Ray Diffraction 3.4756 3.8253 -- 139 2651 0.1464 0.1863 -- 100.0
X Ray Diffraction 3.8253 4.3785 -- 140 2653 0.1417 0.1459 -- 100.0
X Ray Diffraction 4.3785 5.515 -- 143 2708 0.1411 0.1867 -- 100.0
X Ray Diffraction 5.515 46.9944 -- 147 2808 0.1679 0.1983 -- 99.0
RMS Deviations
Key Refinement Restraint Deviation
f_chiral_restr 0.055
f_bond_d 0.012
f_angle_d 1.253
f_plane_restr 0.008
f_dihedral_angle_d 14.102
Coordinate Error
Parameter Value
Luzzati ESD (Observed) 0.22
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 5495
Nucleic Acid Atoms 0
Heterogen Atoms 53
Solvent Atoms 493

Software

Software
Software Name Purpose
PHASER phasing version: 2.5.2
PHENIX refinement version: (phenix.refine: 1.8.2_1309)
XDS data reduction
XSCALE data scaling