X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion Hanging Drop
pH 5.2
Temperature 298.0
Details 26% PEG 400, 100 mM ADA, 100 mM LiSO4, pH 5.2, VAPOR DIFFUSION, HANGING DROP, temperature 298K

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 223.63 α = 90
b = 129.06 β = 94.62
c = 392.37 γ = 90
Symmetry
Space Group C 1 2 1

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 200
Diffraction Detector
Detector Diffraction Type Details Collection Date
CCD MARMOSAIC 300 mm CCD -- 2011-08-23
Diffraction Radiation
Monochromator Protocol
Double crystal cryo-cooled Si(111) SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 23-ID-B 1.0332 APS 23-ID-B

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
3 20 97.7 -- 0.109 -- 2.7 219457 214382 -- -3.0 --
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
3.0 3.11 99.6 -- 0.661 1.8 2.7 --

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
MOLECULAR REPLACEMENT 3.0 19.978 -- 1.42 219457 213992 1895 97.33 -- 0.2789 0.2786 0.3055 Random
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 3.0 3.0748 14553 120 14553 0.3341 0.3418 -- 93.0
X Ray Diffraction 3.0748 3.1576 14839 153 14839 0.3311 0.368 -- 95.0
X Ray Diffraction 3.1576 3.2501 15193 117 15193 0.3253 0.3613 -- 97.0
X Ray Diffraction 3.2501 3.3546 15279 144 15279 0.3144 0.3719 -- 98.0
X Ray Diffraction 3.3546 3.4739 15514 119 15514 0.3034 0.315 -- 99.0
X Ray Diffraction 3.4739 3.6122 15441 157 15441 0.2953 0.3407 -- 99.0
X Ray Diffraction 3.6122 3.7755 15511 113 15511 0.288 0.3363 -- 99.0
X Ray Diffraction 3.7755 3.9731 15429 157 15429 0.2859 0.3328 -- 99.0
X Ray Diffraction 3.9731 4.2198 15482 147 15482 0.2666 0.2854 -- 99.0
X Ray Diffraction 4.2198 4.5421 15453 90 15453 0.254 0.2964 -- 98.0
X Ray Diffraction 4.5421 4.9927 15399 198 15399 0.2546 0.2931 -- 98.0
X Ray Diffraction 4.9927 5.7005 15298 165 15298 0.2678 0.3105 -- 97.0
X Ray Diffraction 5.7005 7.1274 15443 33 15443 0.2958 0.3266 -- 97.0
X Ray Diffraction 7.1274 19.9786 15158 182 15158 0.2514 0.2475 -- 95.0
RMS Deviations
Key Refinement Restraint Deviation
f_chiral_restr 0.057
f_bond_d 0.004
f_angle_d 0.861
f_plane_restr 0.004
f_dihedral_angle_d 13.432
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 44014
Nucleic Acid Atoms 0
Heterogen Atoms 4
Solvent Atoms 0

Software

Software
Software Name Purpose
Blu-Ice data collection
PHASER phasing
PHENIX refinement version: (phenix.refine: 1.8.2_1309)
HKL-2000 data reduction
HKL-2000 data scaling