X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion Hanging Drop
pH 7.5
Temperature 298.0
Details 100mM HEPES pH7.5, 25% PEG 4000, 200mM (NH4)2SO4, 3% v/v CH3CH2OH, VAPOR DIFFUSION, HANGING DROP, temperature 298K

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 278.63 α = 90
b = 78.12 β = 101.9
c = 72.79 γ = 90
Symmetry
Space Group C 1 2 1

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 100
Diffraction Detector
Detector Diffraction Type Details Collection Date
CCD ADSC QUANTUM 4r -- 2011-09-16
Diffraction Radiation
Monochromator Protocol
KOHZU DOUBLE CRYSTAL SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON NSLS BEAMLINE X4A 0.97900 NSLS X4A

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.38 50 99.4 -- 0.059 -- 7.5 95475 60839 -- -- --
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
2.376 2.44 99.3 -- 0.417 7.8 7.6 --

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
MOLECULAR REPLACEMENT 2.3767 37.55 -- 1.34 60839 60769 2005 98.26 -- 0.2137 0.2122 0.2548 --
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 2.3767 2.4361 -- 122 3586 0.2521 0.3135 -- 84.0
X Ray Diffraction 2.4361 2.5019 -- 142 4182 0.252 0.2933 -- 99.0
X Ray Diffraction 2.5019 2.5756 -- 146 4218 0.2595 0.3314 -- 99.0
X Ray Diffraction 2.5756 2.6587 -- 138 4213 0.2506 0.3255 -- 99.0
X Ray Diffraction 2.6587 2.7537 -- 147 4232 0.2513 0.3249 -- 100.0
X Ray Diffraction 2.7537 2.8639 -- 146 4203 0.2637 0.3382 -- 99.0
X Ray Diffraction 2.8639 2.9942 -- 145 4257 0.2486 0.3045 -- 100.0
X Ray Diffraction 2.9942 3.1519 -- 143 4267 0.2435 0.3009 -- 100.0
X Ray Diffraction 3.1519 3.3493 -- 149 4232 0.2371 0.2563 -- 100.0
X Ray Diffraction 3.3493 3.6077 -- 155 4232 0.2161 0.2513 -- 100.0
X Ray Diffraction 3.6077 3.9704 -- 138 4280 0.1958 0.2236 -- 100.0
X Ray Diffraction 3.9704 4.5441 -- 148 4301 0.1744 0.2155 -- 100.0
X Ray Diffraction 4.5441 5.7218 -- 144 4300 0.1809 0.2288 -- 100.0
X Ray Diffraction 5.7218 37.5546 -- 142 4261 0.1984 0.2219 -- 97.0
RMS Deviations
Key Refinement Restraint Deviation
f_dihedral_angle_d 13.921
f_angle_d 0.897
f_plane_restr 0.004
f_bond_d 0.004
f_chiral_restr 0.059
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 8770
Nucleic Acid Atoms 0
Heterogen Atoms 159
Solvent Atoms 107

Software

Software
Software Name Purpose
HKL-2000 data collection
AMoRE phasing
PHENIX refinement version: (phenix.refine: 1.8.1_1168)
HKL-2000 data reduction
HKL-2000 data scaling