X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion Hanging Drop
pH 7.5
Temperature 293.0
Details 0.1 M ammonium sulfate, 0.1 M Tris pH7.5, 30% PEG1500, 0.2 M LiCl, VAPOR DIFFUSION, HANGING DROP, temperature 293K

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 73.26 α = 90
b = 38.58 β = 104.19
c = 122.82 γ = 90
Symmetry
Space Group C 1 2 1

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 100
Diffraction Detector
Detector Diffraction Type Details Collection Date
CCD MARMOSAIC 300 mm CCD -- 2012-06-04
Diffraction Radiation
Monochromator Protocol
-- SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 22-ID 1.000 APS 22-ID

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2 20 92.1 0.081 -- -- -- 22920 21100 1.0 2.0 --
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
2.0 2.2 80.9 0.396 -- -- -- 5639

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
MOLECULAR REPLACEMENT 2.0 19.845 -- -- 22920 21100 844 92.21 0.198 0.198 0.1956 0.2577 RANDOM
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 2.0 2.1252 -- 120 2887 0.3517 0.3917 -- 80.0
X Ray Diffraction 2.1252 2.289 -- 131 3144 0.2966 0.3848 -- 86.0
X Ray Diffraction 2.289 2.519 -- 140 3352 0.2504 0.3052 -- 93.0
X Ray Diffraction 2.519 2.8825 -- 146 3520 0.2075 0.2612 -- 97.0
X Ray Diffraction 2.8825 3.6281 -- 151 3621 0.1663 0.2339 -- 99.0
X Ray Diffraction 3.6281 19.8459 -- 156 3732 0.1461 0.2074 -- 99.0
Temperature Factor Modeling
Temperature Factor Value
Anisotropic B[1][1] -2.148
Anisotropic B[1][2] 0.0
Anisotropic B[1][3] -3.9396
Anisotropic B[2][2] -2.047
Anisotropic B[2][3] 0.0
Anisotropic B[3][3] 4.195
RMS Deviations
Key Refinement Restraint Deviation
f_angle_d 1.185
f_bond_d 0.008
f_dihedral_angle_d 13.869
f_chiral_restr 0.079
f_plane_restr 0.005
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 2942
Nucleic Acid Atoms 0
Heterogen Atoms 5
Solvent Atoms 147

Software

Software
Software Name Purpose
MAR345dtb data collection
PHASES phasing
PHENIX refinement version: 1.7.3_928
XDS data reduction
XDS data scaling