X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion Hanging Drop
pH 4.9
Temperature 291.0
Details 0.1 M sodium acetate pH 4.9, 0.175 M ammonium acetate, 3-5% PEG4000, 0.5-4% PEG400, VAPOR DIFFUSION, HANGING DROP, temperature 291K

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 135.66 α = 90
b = 135.66 β = 90
c = 175.8 γ = 120
Symmetry
Space Group P 31 2 1

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 100
Diffraction Detector
Detector Diffraction Type Details Collection Date
CCD MARMOSAIC 225 mm CCD -- 2010-07-09
CCD MARMOSAIC 225 mm CCD -- 2010-11-04
Diffraction Radiation
Monochromator Protocol
SAGITALLY FOCUSED Si(111) SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 22-BM 0.97937 APS 22-BM
SYNCHROTRON APS BEAMLINE 22-BM 1 APS 22-BM

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.8 50 99.9 0.119 -- -- 15.7 -- 46561 -- -3.0 --
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
2.8 2.85 99.8 -- -- 2.7 11.0 --

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
SAD 2.801 41.487 -- 0.0 -- 46492 2350 99.86 -- 0.23 0.2288 0.2509 random
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 2.8009 2.8581 -- 143 2543 0.3972 0.4052 -- 100.0
X Ray Diffraction 2.8581 2.9202 -- 139 2567 0.3166 0.3224 -- 100.0
X Ray Diffraction 2.9202 2.9881 -- 129 2567 0.2701 0.2691 -- 100.0
X Ray Diffraction 2.9881 3.0628 -- 152 2548 0.2486 0.3077 -- 100.0
X Ray Diffraction 3.0628 3.1456 -- 140 2577 0.2528 0.2669 -- 100.0
X Ray Diffraction 3.1456 3.2381 -- 131 2566 0.2472 0.2718 -- 100.0
X Ray Diffraction 3.2381 3.3426 -- 107 2596 0.2345 0.2348 -- 100.0
X Ray Diffraction 3.3426 3.462 -- 137 2610 0.2309 0.2686 -- 100.0
X Ray Diffraction 3.462 3.6006 -- 130 2562 0.2218 0.2652 -- 100.0
X Ray Diffraction 3.6006 3.7643 -- 135 2615 0.2176 0.2372 -- 100.0
X Ray Diffraction 3.7643 3.9626 -- 150 2566 0.2139 0.2515 -- 100.0
X Ray Diffraction 3.9626 4.2107 -- 146 2583 0.206 0.229 -- 100.0
X Ray Diffraction 4.2107 4.5354 -- 140 2625 0.1908 0.2129 -- 100.0
X Ray Diffraction 4.5354 4.9912 -- 134 2598 0.1939 0.2305 -- 100.0
X Ray Diffraction 4.9912 5.7118 -- 141 2646 0.2486 0.2568 -- 100.0
X Ray Diffraction 5.7118 7.1902 -- 143 2650 0.2609 0.2641 -- 100.0
X Ray Diffraction 7.1902 41.4917 -- 153 2723 0.2156 0.2298 -- 99.0
Temperature Factor Modeling
Temperature Factor Value
Anisotropic B[1][1] -3.6716
Anisotropic B[1][2] 0.0
Anisotropic B[1][3] 0.0
Anisotropic B[2][2] -3.6716
Anisotropic B[2][3] 0.0
Anisotropic B[3][3] 7.3433
RMS Deviations
Key Refinement Restraint Deviation
f_angle_d 0.64
f_dihedral_angle_d 14.895
f_chiral_restr 0.06
f_plane_restr 0.002
f_bond_d 0.002
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 7322
Nucleic Acid Atoms 0
Heterogen Atoms 101
Solvent Atoms 85

Software

Software
Software Name Purpose
HKL-2000 data collection
CNS refinement
PHENIX refinement version: (phenix.refine: 1.7.3_928)
HKL-2000 data reduction
HKL-2000 data scaling
CNS phasing