X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion Sitting Drop
pH 7.5
Temperature 289.0
Details 2.0 M ammonium sulfate, 0.1 M HEPES pH 7.5, VAPOR DIFFUSION, SITTING DROP, temperature 289K

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 37.12 α = 90
b = 92.15 β = 90
c = 92 γ = 90
Symmetry
Space Group C 2 2 21

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 100
Diffraction Detector
Detector Diffraction Type Details Collection Date
CCD ADSC QUANTUM 315r mirrors 2012-08-18
Diffraction Radiation
Monochromator Protocol
double crystal monochromator SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 19-ID 0.97935 APS 19-ID

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.9 50 98.3 -- 0.087 -- 4.6 12529 12529 0.0 0.0 28.4
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1.9 1.93 99.5 -- 0.561 2.2 4.6 607

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
SAD 1.905 32.248 -- 0.0 12249 12249 1221 96.26 0.177 0.177 0.173 0.216 random
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 1.9051 1.9814 1269 124 1145 0.2218 0.2541 -- 92.0
X Ray Diffraction 1.9814 2.0715 1345 134 1211 0.1862 0.2311 -- 96.0
X Ray Diffraction 2.0715 2.1807 1343 134 1209 0.1691 0.2522 -- 97.0
X Ray Diffraction 2.1807 2.3173 1357 135 1222 0.1658 0.227 -- 97.0
X Ray Diffraction 2.3173 2.4962 1359 135 1224 0.1724 0.2524 -- 97.0
X Ray Diffraction 2.4962 2.7473 1371 138 1233 0.1801 0.2205 -- 98.0
X Ray Diffraction 2.7473 3.1445 1387 139 1248 0.1768 0.2292 -- 97.0
X Ray Diffraction 3.1445 3.9606 1391 139 1252 0.1644 0.2009 -- 97.0
X Ray Diffraction 3.9606 32.253 1427 143 1284 0.1701 0.1929 -- 95.0
Temperature Factor Modeling
Temperature Factor Value
Isotropic Thermal Model mixed
Mean Isotropic B 33.9
RMS Deviations
Key Refinement Restraint Deviation
f_bond_d 0.006
f_chiral_restr 0.061
f_plane_restr 0.003
f_angle_d 0.854
f_dihedral_angle_d 15.344
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 1054
Nucleic Acid Atoms 0
Heterogen Atoms 34
Solvent Atoms 95

Software

Software
Software Name Purpose
SBC-Collect data collection
HKL-3000 data collection
HKL-3000 phasing
PHENIX model building
PHENIX refinement version: (phenix.refine: 1.8.1_1161)
HKL-3000 data reduction
HKL-3000 data scaling
PHENIX phasing