X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion Sitting Drop
pH 7.5
Temperature 295.0
Details Internal tracking number 233897a9. Puck VKT6-9, JCSG_A8 optimization. 50mM Ammonium formate, 24.55% PEG 3,350, 10% ethylene glycol. BupsA.00130.a.D214, 20.00 mg/ml, CJ168 (EBSI2861), pH 7.5, vapor diffusion, sitting drop, temperature 295K

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 33.63 α = 91.54
b = 35.11 β = 99.9
c = 75.15 γ = 97.23
Symmetry
Space Group P 1

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 100
Diffraction Detector
Detector Diffraction Type Details Collection Date
CCD ADSC QUANTUM 315r -- 2012-05-26
Diffraction Radiation
Monochromator Protocol
Si(220) Asymmetric cut single crystal SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON ALS BEAMLINE 5.0.1 0.9774 ALS 5.0.1

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.75 37 97.1 0.055 -- -- 3.2 33838 32845 0.0 -3.0 25.712
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1.75 1.8 95.5 0.52 -- 2.5 -- --

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
MR 1.75 37.0 0.0 0.0 33838 32845 1662 97.09 0.172 0.172 0.17 0.219 RANDOM
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 1.75 1.795 -- 94 2261 0.242 0.302 -- 95.46
Temperature Factor Modeling
Temperature Factor Value
Mean Isotropic B 24.145
Anisotropic B[1][1] 0.3
Anisotropic B[1][2] 1.03
Anisotropic B[1][3] 0.87
Anisotropic B[2][2] 0.16
Anisotropic B[2][3] -0.09
Anisotropic B[3][3] -0.7
RMS Deviations
Key Refinement Restraint Deviation
r_dihedral_angle_4_deg 16.587
r_angle_refined_deg 1.533
r_angle_other_deg 1.071
r_bond_other_d 0.007
r_dihedral_angle_2_deg 31.123
r_dihedral_angle_3_deg 13.512
r_gen_planes_other 0.004
r_chiral_restr 0.088
r_dihedral_angle_1_deg 6.499
r_gen_planes_refined 0.007
r_bond_refined_d 0.016
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 2852
Nucleic Acid Atoms 0
Heterogen Atoms 88
Solvent Atoms 325

Software

Software
Software Name Purpose
XSCALE data scaling
PHASER phasing
REFMAC refinement version: 5.7.0029
PDB_EXTRACT data extraction version: 3.004
XDS data reduction