X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
pH 6.4
Temperature 293.0
Details 0.9 M sodium citrate pH 6.4, 0.25 M potassium chloride, 1% v/v ethanol, 3 % v/v acetonitrile, 6 % v/v ethylene glycol and 10 mM spermidine, VAPOR DIFFUSION, SITTING DROP, temperature 293K

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 85.45 α = 90
b = 103.31 β = 90
c = 256.03 γ = 90
Symmetry
Space Group P 21 21 21

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 100
2 100
Diffraction Detector
Detector Diffraction Type Details Collection Date
PIXEL PSI PILATUS 6M -- 2011-07-04
CCD ADSC QUANTUM 315r -- 2011-06-14
Diffraction Radiation
Monochromator Protocol
-- SINGLE WAVELENGTH
-- SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON SOLEIL BEAMLINE PROXIMA 1 0.97892 SOLEIL PROXIMA 1
SYNCHROTRON ESRF BEAMLINE ID29 0.97892 ESRF ID29

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
3.6 45.9 99.6 -- -- -- -- -- 26960 -- -- --
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
3.6 3.73 99.6 -- -- -- -- --

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
MOLECULAR REPLACEMENT 3.6 45.896 -- 1.99 27065 26948 1348 99.63 -- 0.2036 0.2 0.2688 --
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 3.6 3.7286 -- 133 2522 0.2696 0.3528 -- 100.0
X Ray Diffraction 3.7286 3.8778 -- 132 2516 0.2652 0.3823 -- 100.0
X Ray Diffraction 3.8778 4.0542 -- 133 2530 0.2366 0.3801 -- 100.0
X Ray Diffraction 4.0542 4.2678 -- 133 2515 0.207 0.2452 -- 100.0
X Ray Diffraction 4.2678 4.535 -- 134 2545 0.1755 0.2405 -- 100.0
X Ray Diffraction 4.535 4.8848 -- 133 2531 0.1613 0.2418 -- 100.0
X Ray Diffraction 4.8848 5.3757 -- 135 2566 0.1737 0.2459 -- 100.0
X Ray Diffraction 5.3757 6.152 -- 136 2587 0.1931 0.2637 -- 100.0
X Ray Diffraction 6.152 7.7448 -- 137 2590 0.2063 0.2819 -- 99.0
X Ray Diffraction 7.7448 45.8998 -- 142 2698 0.1982 0.2411 -- 98.0
RMS Deviations
Key Refinement Restraint Deviation
f_chiral_restr 0.077
f_bond_d 0.005
f_plane_restr 0.008
f_dihedral_angle_d 20.126
f_angle_d 1.117
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 12685
Nucleic Acid Atoms 0
Heterogen Atoms 109
Solvent Atoms 0

Software

Software
Software Name Purpose
PHASER phasing
PHENIX refinement version: (phenix.refine: 1.8_1069)
XDS data reduction
XSCALE data scaling