X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion Sitting Drop
pH 9.5
Temperature 298.0
Details 100 mM CHES, pH 9.5, 5-10% w/v PEG3350, VAPOR DIFFUSION, SITTING DROP, temperature 298K

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 53.41 α = 90
b = 62.9 β = 90
c = 111.44 γ = 90
Symmetry
Space Group P 21 21 21

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 100
Diffraction Detector
Detector Diffraction Type Details Collection Date
PIXEL PSI PILATUS 6M -- 2011-03-21
Diffraction Radiation
Monochromator Protocol
double crystal sagitally focusing Si(111) SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON SLS BEAMLINE X10SA 0.9786 SLS X10SA

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.5 48.2 99.9 -- -- -- 6.4 13553 13540 0.0 0.0 --
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
2.5 2.6 99.9 -- -- 4.43 6.6 --

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
MOLECULAR REPLACEMENT 2.5 48.17 -- -- 13553 12869 671 100.0 -- 0.19905 0.19648 0.24893 RANDOM
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 2.5 2.565 -- 51 936 0.21 0.252 -- 100.0
Temperature Factor Modeling
Temperature Factor Value
Mean Isotropic B 29.447
Anisotropic B[1][1] -1.32
Anisotropic B[1][2] 0.0
Anisotropic B[1][3] 0.0
Anisotropic B[2][2] 1.85
Anisotropic B[2][3] 0.0
Anisotropic B[3][3] -0.53
RMS Deviations
Key Refinement Restraint Deviation
r_mcangle_it 0.973
r_scbond_it 1.61
r_dihedral_angle_3_deg 15.843
r_mcbond_it 0.49
r_dihedral_angle_4_deg 17.283
r_chiral_restr 0.083
r_dihedral_angle_1_deg 5.475
r_angle_refined_deg 1.169
r_scangle_it 2.608
r_bond_refined_d 0.009
r_dihedral_angle_2_deg 37.414
r_gen_planes_refined 0.005
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 2622
Nucleic Acid Atoms 0
Heterogen Atoms 33
Solvent Atoms 74

Software

Software
Software Name Purpose
XDS data scaling
REFMAC refinement
XDS data reduction
REFMAC phasing