X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Batch
Temperature 293.0
Details After crystallization, the solution used for growing the crystals (20 % NaCl, 6 % PEG 6000, 1 M Na acetate pH 3.0) was exchanged for storage solution (10 % NaCl, 1.0 M Na acetate pH 3.4), BATCH, temperature 293K

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 79 α = 90
b = 79 β = 90
c = 38 γ = 90
Symmetry
Space Group P 43 21 2

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 293
Diffraction Detector
Detector Diffraction Type Details Collection Date
PIXEL -- -- 2011-02-01
Diffraction Radiation
Monochromator Protocol
CXI SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
FREE ELECTRON LASER SLAC LCLS BEAMLINE CXI 1.32 SLAC LCLS CXI

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.9 35.3 98.2 -- -- -- -- 9743 9743 0.0 0.0 --
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1.9 2.0 91.2 -- -- -- -- --

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
FOURIER SYNTHESIS 1.9 35.3 -- 1.48 9743 9743 497 98.21 -- 0.1909 0.189 0.2265 RANDOM
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 1.9 2.0912 -- 123 2199 0.2301 0.269 -- 97.0
X Ray Diffraction 2.0912 2.3937 -- 120 2266 0.1735 0.2249 -- 98.0
X Ray Diffraction 2.3937 3.0156 -- 128 2317 0.1765 0.208 -- 99.0
X Ray Diffraction 3.0156 35.336 -- 126 2464 0.1924 0.2296 -- 99.0
Temperature Factor Modeling
Temperature Factor Value
Anisotropic B[1][1] -1.3109
Anisotropic B[1][2] 0.0
Anisotropic B[1][3] 0.0
Anisotropic B[2][2] -1.3109
Anisotropic B[2][3] 0.0
Anisotropic B[3][3] 2.6219
RMS Deviations
Key Refinement Restraint Deviation
f_chiral_restr 0.076
f_bond_d 0.006
f_plane_restr 0.003
f_angle_d 1.025
f_dihedral_angle_d 14.114
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 1001
Nucleic Acid Atoms 0
Heterogen Atoms 2
Solvent Atoms 87

Software

Software
Software Name Purpose
CXI data collection version: DAQ
PHENIX model building
PHENIX refinement version: (phenix.refine: 1.7.2_869)
CrystFEL data reduction
CrystFEL data scaling
PHENIX phasing