X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion Hanging Drop
pH 6
Temperature 293.0
Details 0.1M MES, 6-17%(W/V) PEG 2K-MME, pH 6.0, VAPOR DIFFUSION, HANGING DROP, temperature 293K

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 98.79 α = 90
b = 98.79 β = 90
c = 82.43 γ = 120
Symmetry
Space Group P 61

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 95
Diffraction Detector
Detector Diffraction Type Details Collection Date
CCD RIGAKU SATURN A200 -- 2011-05-27
Diffraction Radiation
Monochromator Protocol
-- SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
ROTATING ANODE RIGAKU MICROMAX-007 HF -- -- --

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.2 50 89.2 -- 0.11 -- 2.2 -- 20425 -- -- 16.15
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
2.2 2.26 78.1 -- 0.445 2.1 2.1 --

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
FOURIER SYNTHESIS 2.211 24.012 -- 0.01 -- 18862 964 82.26 -- 0.2009 0.1978 0.2568 --
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 2.2113 2.3278 -- 114 2092 0.2545 0.3143 -- 68.0
X Ray Diffraction 2.3278 2.4735 -- 127 2356 0.2345 0.283 -- 76.0
X Ray Diffraction 2.4735 2.6642 -- 131 2442 0.2297 0.3218 -- 79.0
X Ray Diffraction 2.6642 2.9319 -- 132 2610 0.2267 0.2853 -- 84.0
X Ray Diffraction 2.9319 3.3552 -- 145 2736 0.197 0.277 -- 88.0
X Ray Diffraction 3.3552 4.2235 -- 155 2855 0.1518 0.2113 -- 92.0
X Ray Diffraction 4.2235 24.0131 -- 160 2807 0.1629 0.2053 -- 89.0
Temperature Factor Modeling
Temperature Factor Value
Mean Isotropic B 20.5522
Anisotropic B[1][1] 0.5028
Anisotropic B[1][2] 0.0
Anisotropic B[1][3] 0.0
Anisotropic B[2][2] 0.5028
Anisotropic B[2][3] 0.0
Anisotropic B[3][3] -1.0055
RMS Deviations
Key Refinement Restraint Deviation
f_plane_restr 0.003
f_angle_d 0.818
f_bond_d 0.004
f_dihedral_angle_d 16.673
f_chiral_restr 0.051
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 3376
Nucleic Acid Atoms 408
Heterogen Atoms 12
Solvent Atoms 225

Software

Software
Software Name Purpose
StructureStudio data collection
PHENIX refinement version: (phenix.refine: 1.6.1_357)
XDS data reduction
XDS data scaling