X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion Sitting Drop
Temperature 293.0
Details 20.00% Glycerol 20.00% polyethylene glycol 4000, NANODROP, VAPOR DIFFUSION, SITTING DROP, temperature 293K

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 238.73 α = 90
b = 92.82 β = 125.26
c = 173.89 γ = 90
Symmetry
Space Group C 1 2 1

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 100
Diffraction Detector
Detector Diffraction Type Details Collection Date
CCD MARMOSAIC 325 mm CCD Flat mirror (vertical focusing); single crystal Si(111) bent monochromator (ho rizontal focusing) 2011-07-22
Diffraction Radiation
Monochromator Protocol
single crystal Si(111) bent MAD
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON SSRL BEAMLINE BL11-1 0.91837,0.97941,0.97899 SSRL BL11-1

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.17 48.73 99.0 0.11 -- -- -- -- 162812 -- -3.0 32.817
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
2.17 2.25 98.7 0.765 -- 1.9 -- --

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
MAD 2.17 48.732 -- 0.0 -- 162808 8179 99.24 -- 0.1577 0.1561 0.1878 RANDOM
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 2.17 2.23 -- 597 11308 0.2028 0.2249 -- 99.24
Temperature Factor Modeling
Temperature Factor Value
Mean Isotropic B 37.341
Anisotropic B[1][1] 4.1412
Anisotropic B[1][2] 0.0
Anisotropic B[1][3] -3.1263
Anisotropic B[2][2] -0.3494
Anisotropic B[2][3] 0.0
Anisotropic B[3][3] -3.7918
RMS Deviations
Key Refinement Restraint Deviation
t_angle_deg 1.01
t_bond_d 0.01
t_omega_torsion 3.77
t_other_torsion 2.69
Coordinate Error
Parameter Value
Luzzati ESD (Observed) 0.226
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 19214
Nucleic Acid Atoms 0
Heterogen Atoms 400
Solvent Atoms 1947

Software

Software
Software Name Purpose
MolProbity model building version: 3beta29
PDB_EXTRACT data extraction version: 3.10
SHELX phasing
SHARP phasing
XSCALE data scaling version: December 6, 2010
BUSTER-TNT refinement version: 2.10.0
XDS data reduction
SHELXD phasing
BUSTER refinement version: 2.10.0