X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 228.21 α = 90
b = 77.53 β = 100.96
c = 72.02 γ = 90
Symmetry
Space Group C 1 2 1

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 100
2 90
Diffraction Detector
Detector Diffraction Type Details Collection Date
CCD ADSC QUANTUM 210 -- --
CCD ADSC QUANTUM 210 -- --
Diffraction Radiation
Monochromator Protocol
-- SINGLE WAVELENGTH
-- MAD
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON PAL/PLS BEAMLINE 6C1 -- PAL/PLS 6C1
SYNCHROTRON SPRING-8 BEAMLINE BL44XU -- SPring-8 BL44XU

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.6 40.33 99.2 -- -- -- -- -- 41574 -- -- --

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
MAD 2.6 40.0 -- 1.35 41574 37359 1901 97.76 0.2173 0.2173 0.2148 0.2643 --
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 2.6 2.6651 -- 127 2604 0.2682 0.3044 -- 100.0
X Ray Diffraction 2.6651 2.7371 -- 163 2547 0.2659 0.3286 -- 100.0
X Ray Diffraction 2.7371 2.8176 -- 136 2542 0.2654 0.3549 -- 100.0
X Ray Diffraction 2.8176 2.9085 -- 120 2591 0.2554 0.305 -- 100.0
X Ray Diffraction 2.9085 3.0125 -- 145 2587 0.2453 0.3303 -- 100.0
X Ray Diffraction 3.0125 3.133 -- 141 2569 0.2356 0.302 -- 100.0
X Ray Diffraction 3.133 3.2756 -- 127 2601 0.2362 0.273 -- 100.0
X Ray Diffraction 3.2756 3.4482 -- 136 2565 0.2277 0.2883 -- 100.0
X Ray Diffraction 3.4482 3.6641 -- 155 2568 0.203 0.2417 -- 100.0
X Ray Diffraction 3.6641 3.9467 -- 145 2565 0.1937 0.2126 -- 100.0
X Ray Diffraction 3.9467 4.3435 -- 137 2594 0.1806 0.2202 -- 100.0
X Ray Diffraction 4.3435 4.971 -- 138 2595 0.1901 0.2689 -- 99.0
X Ray Diffraction 4.971 6.2592 -- 130 2611 0.2299 0.2753 -- 99.0
X Ray Diffraction 6.2592 40.3357 -- 101 1919 0.2195 0.2606 -- 72.0
RMS Deviations
Key Refinement Restraint Deviation
f_bond_d 0.022
f_angle_d 1.218
f_plane_restr 0.005
f_chiral_restr 0.061
f_dihedral_angle_d 15.267
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 7524
Nucleic Acid Atoms 0
Heterogen Atoms 4
Solvent Atoms 60

Software

Software
Software Name Purpose
HKL-2000 data collection
PHENIX model building
PHENIX refinement version: (phenix.refine: 1.8.1_1168)
HKL-2000 data reduction
HKL-2000 data scaling
PHENIX phasing