X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion Sitting Drop
pH 7
Temperature 291.0
Details 3.5 M sodium formate pH 7.0, VAPOR DIFFUSION, SITTING DROP, temperature 291K

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 101.09 α = 90
b = 101.09 β = 90
c = 106.93 γ = 120
Symmetry
Space Group P 31 2 1

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 100
Diffraction Detector
Detector Diffraction Type Details Collection Date
PIXEL DECTRIS PILATUS 6M Mirrors 2011-12-13
Diffraction Radiation
Monochromator Protocol
Si 111 CHANNEL SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON NSLS BEAMLINE X29A 0.9792 NSLS X29A

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.5 50 95.7 0.176 -- -- 6.0 -- 21143 0.0 0.0 --
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
2.5 2.59 100.0 0.53 -- 5.3 5.6 2171

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
MOLECULAR REPLACEMENT 2.51 43.774 -- 0.03 -- 20523 1058 93.01 -- 0.1995 0.1967 0.2513 RANDOM
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 2.5099 2.6241 -- 131 2413 0.2242 0.3031 -- 93.0
X Ray Diffraction 2.6241 2.7624 -- 156 2441 0.2314 0.2918 -- 96.0
X Ray Diffraction 2.7624 2.9355 -- 127 2539 0.2257 0.2797 -- 98.0
X Ray Diffraction 2.9355 3.1621 -- 145 2538 0.2243 0.2881 -- 99.0
X Ray Diffraction 3.1621 3.4802 -- 136 2559 0.2006 0.2673 -- 98.0
X Ray Diffraction 3.4802 3.9835 -- 91 1583 0.1933 0.249 -- 61.0
X Ray Diffraction 3.9835 5.0176 -- 132 2643 0.152 0.2021 -- 100.0
X Ray Diffraction 5.0176 43.7803 -- 140 2749 0.1869 0.2172 -- 100.0
Temperature Factor Modeling
Temperature Factor Value
Anisotropic B[1][1] 11.4442
Anisotropic B[1][2] 0.0
Anisotropic B[1][3] 0.0
Anisotropic B[2][2] 11.4442
Anisotropic B[2][3] 0.0
Anisotropic B[3][3] -22.8885
RMS Deviations
Key Refinement Restraint Deviation
f_dihedral_angle_d 20.193
f_chiral_restr 0.088
f_bond_d 0.013
f_plane_restr 0.01
f_angle_d 1.431
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 2934
Nucleic Acid Atoms 0
Heterogen Atoms 53
Solvent Atoms 104

Software

Software
Software Name Purpose
CBASS data collection
SHELXS phasing
PHENIX refinement version: (phenix.refine)
HKL-2000 data reduction
HKL-2000 data scaling