X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion Sitting Drop
pH 7
Temperature 291.0
Details 0.1 M Hepes, 17% PEG 4000, 0.1 MgCl2, pH 7.0, VAPOR DIFFUSION, SITTING DROP, temperature 291K

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 66.59 α = 90
b = 117.61 β = 90
c = 190.66 γ = 90
Symmetry
Space Group P 21 21 21

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 100
Diffraction Detector
Detector Diffraction Type Details Collection Date
IMAGE PLATE MAR scanner 300 mm plate -- 2010-06-21
Diffraction Radiation
Monochromator Protocol
-- SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 23-ID-D 0.97918 APS 23-ID-D

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
3.06 20.02 89.18 -- -- -- -- -- 27183 -- -- --
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
3.056 3.1781 -- -- -- -- -- --

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
MOLECULAR REPLACEMENT 3.056 20.019 -- 1.34 -- 27183 1359 93.61 -- 0.239 0.2363 0.2885 --
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 3.056 3.1649 -- 130 2417 0.3361 0.4088 -- 89.0
X Ray Diffraction 3.1649 3.2911 -- 136 2459 0.3073 0.3443 -- 91.0
X Ray Diffraction 3.2911 3.4401 -- 113 2460 0.2787 0.365 -- 91.0
X Ray Diffraction 3.4401 3.6205 -- 138 2464 0.2736 0.3211 -- 91.0
X Ray Diffraction 3.6205 3.8458 -- 125 2491 0.2606 0.3101 -- 91.0
X Ray Diffraction 3.8458 4.1403 -- 124 2564 0.2386 0.3049 -- 93.0
X Ray Diffraction 4.1403 4.5526 -- 144 2587 0.2038 0.2577 -- 95.0
X Ray Diffraction 4.5526 5.2012 -- 151 2709 0.1939 0.2405 -- 97.0
X Ray Diffraction 5.2012 6.5152 -- 153 2764 0.2408 0.2928 -- 99.0
X Ray Diffraction 6.5152 20.0192 -- 145 2909 0.2078 0.2486 -- 99.0
Temperature Factor Modeling
Temperature Factor Value
Anisotropic B[1][1] 2.5279
Anisotropic B[1][2] 0.0
Anisotropic B[1][3] 0.0
Anisotropic B[2][2] -15.2245
Anisotropic B[2][3] 0.0
Anisotropic B[3][3] 12.6966
RMS Deviations
Key Refinement Restraint Deviation
f_angle_d 0.668
f_plane_restr 0.002
f_bond_d 0.003
f_dihedral_angle_d 13.602
f_chiral_restr 0.047
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 9421
Nucleic Acid Atoms 0
Heterogen Atoms 83
Solvent Atoms 5

Software

Software
Software Name Purpose
PHASER phasing
PHENIX refinement version: 1.7.3_928
PDB_EXTRACT data extraction version: 3.10
HKL-2000 data collection
DENZO data reduction
SCALEPACK data scaling