X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion Sitting Drop
pH 7.5
Temperature 298.0
Details 100 mM HEPES, pH 7.5 25% PEG 6000 , VAPOR DIFFUSION, SITTING DROP, temperature 298K

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 49.25 α = 90
b = 37.19 β = 107.66
c = 53 γ = 90
Symmetry
Space Group P 1 21 1

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 100
Diffraction Detector
Detector Diffraction Type Details Collection Date
CCD MAR CCD 165 mm -- 2010-10-28
Diffraction Radiation
Monochromator Protocol
Si(111) SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON NSLS BEAMLINE X4C 0.979 NSLS X4C

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.3 100 85.9 -- 0.047 -- 3.4 8329 7154 0.0 -3.0 --
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
2.3 2.34 50.0 -- 0.186 3.5 3.0 --

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
MOLECULAR REPLACEMENT 2.3 25.73 -- -- 8317 6776 366 85.87 -- 0.2181 0.21563 0.2659 RANDOM
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 2.3 2.359 -- 15 286 0.393 0.502 -- 50.5
Temperature Factor Modeling
Temperature Factor Value
Mean Isotropic B 73.938
Anisotropic B[1][1] 6.74
Anisotropic B[1][2] 0.0
Anisotropic B[1][3] 1.25
Anisotropic B[2][2] -1.48
Anisotropic B[2][3] 0.0
Anisotropic B[3][3] -4.5
RMS Deviations
Key Refinement Restraint Deviation
r_scbond_it 0.879
r_dihedral_angle_2_deg 31.673
r_dihedral_angle_3_deg 14.606
r_scangle_it 1.46
r_dihedral_angle_1_deg 5.424
r_angle_refined_deg 1.328
r_dihedral_angle_4_deg 13.149
r_mcbond_other 0.051
r_bond_refined_d 0.008
r_angle_other_deg 0.893
r_chiral_restr 0.067
r_bond_other_d 0.001
r_gen_planes_refined 0.004
r_mcbond_it 0.259
r_mcangle_it 0.514
r_gen_planes_other 0.001
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 1228
Nucleic Acid Atoms 0
Heterogen Atoms 81
Solvent Atoms 0

Software

Software
Software Name Purpose
HKL-2000 data collection
PHASER phasing
REFMAC refinement version: 5.5.0072
HKL-2000 data reduction
HKL-2000 data scaling