X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion Hanging Drop
pH 7
Temperature 292.0
Details 2 mM DTT, 100 mM Bis-Tris Propane,1.8 M Na-acetate, pH 7.0, VAPOR DIFFUSION, HANGING DROP, temperature 292K

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 55.19 α = 90
b = 90.59 β = 90
c = 96.08 γ = 90
Symmetry
Space Group P 21 21 21

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 100
Diffraction Detector
Detector Diffraction Type Details Collection Date
CCD ADSC QUANTUM 315r -- 2009-11-20
Diffraction Radiation
Monochromator Protocol
Aluminium or Carbon foils SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON ESRF BEAMLINE ID23-1 0.93 ESRF ID23-1

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.2 47.85 96.42 -- -- -- -- 24066 24066 0.0 0.0 --
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
2.2 2.29 95.0 -- -- -- -- --

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
MOLECULAR REPLACEMENT 2.2044 47.853 -- 1.34 24066 24066 1236 96.42 -- 0.1712 0.1686 0.2199 random
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 2.2044 2.2927 -- 145 2426 0.2248 0.2886 -- 95.0
X Ray Diffraction 2.2927 2.397 -- 146 2524 0.2046 0.2563 -- 98.0
X Ray Diffraction 2.397 2.5234 -- 129 2563 0.2005 0.2552 -- 98.0
X Ray Diffraction 2.5234 2.6815 -- 142 2523 0.194 0.2819 -- 98.0
X Ray Diffraction 2.6815 2.8885 -- 140 2540 0.1775 0.2771 -- 97.0
X Ray Diffraction 2.8885 3.1791 -- 132 2551 0.1704 0.2239 -- 97.0
X Ray Diffraction 3.1791 3.639 -- 115 2573 0.141 0.1761 -- 97.0
X Ray Diffraction 3.639 4.5842 -- 151 2520 0.1288 0.1917 -- 95.0
X Ray Diffraction 4.5842 47.8641 -- 136 2610 0.1799 0.2013 -- 93.0
Temperature Factor Modeling
Temperature Factor Value
Anisotropic B[1][1] 1.6529
Anisotropic B[1][2] 0.0
Anisotropic B[1][3] 0.0
Anisotropic B[2][2] -0.2418
Anisotropic B[2][3] 0.0
Anisotropic B[3][3] -1.4111
RMS Deviations
Key Refinement Restraint Deviation
f_angle_d 0.977
f_dihedral_angle_d 17.79
f_plane_restr 0.004
f_bond_d 0.007
f_chiral_restr 0.069
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 3353
Nucleic Acid Atoms 0
Heterogen Atoms 14
Solvent Atoms 311

Software

Software
Software Name Purpose
HKL-2000 data collection
PHENIX model building
PHENIX refinement version: (phenix.refine)
HKL-2000 data reduction
HKL-2000 data scaling
PHENIX phasing