X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion Sitting Drop
pH 7.5
Temperature 277.0
Details 0.25M KSCN, 10% PEG 3350, 5% EtGly, pH 7.5, VAPOR DIFFUSION, SITTING DROP, temperature 277K

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 42.36 α = 90
b = 61.92 β = 111.38
c = 58.42 γ = 90
Symmetry
Space Group P 1 21 1

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 100
Diffraction Detector
Detector Diffraction Type Details Collection Date
IMAGE PLATE RIGAKU RAXIS IV -- 2011-02-08
Diffraction Radiation
Monochromator Protocol
-- SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
ROTATING ANODE RIGAKU FR-E SUPERBRIGHT 1.52 -- --

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.8 27.52 95.4 0.095 0.095 -- 2.7 26124 24922 -- -- 14.0
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1.8 1.9 92.4 0.265 0.265 2.9 2.7 3517

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
MOLECULAR REPLACEMENT 1.8 27.52 -- 0.0 26210 24905 1279 95.02 0.1893 0.1893 0.1874 0.2243 RANDOM
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 1.8 1.847 -- 84 1665 0.255 0.29 -- 91.86
Temperature Factor Modeling
Temperature Factor Value
Mean Isotropic B 12.2571
Anisotropic B[1][1] -0.3
Anisotropic B[1][2] 0.0
Anisotropic B[1][3] 0.01
Anisotropic B[2][2] -0.18
Anisotropic B[2][3] 0.0
Anisotropic B[3][3] 0.48
RMS Deviations
Key Refinement Restraint Deviation
r_gen_planes_other 0.001
r_angle_other_deg 0.917
r_gen_planes_refined 0.008
r_angle_refined_deg 1.611
r_bond_refined_d 0.016
r_dihedral_angle_4_deg 18.195
r_dihedral_angle_3_deg 14.697
r_bond_other_d 0.001
r_dihedral_angle_2_deg 35.912
r_dihedral_angle_1_deg 5.467
r_chiral_restr 0.089
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 1964
Nucleic Acid Atoms 0
Heterogen Atoms 80
Solvent Atoms 232

Software

Software
Software Name Purpose
SCALA data scaling version: 3.3.16
PHASER phasing version: 2.1.4
REFMAC refinement
PDB_EXTRACT data extraction version: 3.10
CrystalClear data collection
MOSFLM data reduction