X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion Sitting Drop
pH 6.5
Temperature 293.0
Details 17% poly(acrylic acid) 5100, 0.4 M magnesium sulfate, 0.1 M HEPES, pH 6.5, VAPOR DIFFUSION, SITTING DROP, temperature 293K

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 73.1 α = 90
b = 110.19 β = 90
c = 202.86 γ = 90
Symmetry
Space Group P 21 21 21

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 100
2 100
Diffraction Detector
Detector Diffraction Type Details Collection Date
CCD ADSC QUANTUM 315r -- 2010-05-21
CCD ADSC QUANTUM 315r -- 2010-06-28
Diffraction Radiation
Monochromator Protocol
Double-crystal, Si(111) MAD
Double crystal, Si(111) SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON ALS BEAMLINE 8.2.1 -- ALS 8.2.1
SYNCHROTRON ALS BEAMLINE 5.0.2 0.9645, 0.9797, 0.9796 ALS 5.0.2

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.9 50 99.9 0.11 -- -- 5.9 35368 35220 2.0 2.0 --
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
2.9 2.95 100.0 0.723 -- 2.0 5.9 --

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
MAD 3.0 50.0 -- -- -- 31804 1698 99.41 -- 0.21219 0.20982 0.25584 RANDOM
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 3.0 3.076 -- 100 2062 0.295 0.352 -- 96.35
Temperature Factor Modeling
Temperature Factor Value
Isotropic Thermal Model ISOTROPIC
Mean Isotropic B 74.931
Anisotropic B[1][1] -3.48
Anisotropic B[1][2] 0.0
Anisotropic B[1][3] 0.0
Anisotropic B[2][2] 5.63
Anisotropic B[2][3] 0.0
Anisotropic B[3][3] -2.15
RMS Deviations
Key Refinement Restraint Deviation
r_dihedral_angle_4_deg 23.33
r_scangle_it 3.08
r_dihedral_angle_1_deg 9.227
r_gen_planes_refined 0.015
r_angle_refined_deg 1.014
r_mcbond_it 0.757
r_bond_refined_d 0.007
r_chiral_restr 0.075
r_mcangle_it 1.4
r_dihedral_angle_2_deg 37.213
r_dihedral_angle_3_deg 24.912
r_scbond_it 1.776
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 11010
Nucleic Acid Atoms 0
Heterogen Atoms 207
Solvent Atoms 0

Software

Software
Software Name Purpose
HKL-2000 data collection
SOLVE phasing
REFMAC refinement version: 5.5.0102
HKL-2000 data reduction
HKL-2000 data scaling