X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion Hanging Drop
pH 5.5
Temperature 298.0
Details 1.8 M ammonium sulfate, 0.1 M Bis-Tris, pH 5.5, VAPOR DIFFUSION, HANGING DROP, temperature 298.0K

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 213.47 α = 90
b = 215.73 β = 90
c = 73.71 γ = 90
Symmetry
Space Group C 2 2 21

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 100
Diffraction Detector
Detector Diffraction Type Details Collection Date
CCD ADSC QUANTUM 315 -- 2010
CCD ADSC QUANTUM 315 -- --
CCD ADSC QUANTUM 315r -- --
Diffraction Radiation
Monochromator Protocol
Si(220) SINGLE WAVELENGTH
Si(111) SINGLE WAVELENGTH
KOHZU SINGLE WAVELENGTH
-- SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON ALS BEAMLINE 5.0.1 -- ALS 5.0.1
SYNCHROTRON ALS BEAMLINE 5.0.2 -- ALS 5.0.2
SYNCHROTRON ALS BEAMLINE 8.2.1 -- ALS 8.2.1
ROTATING ANODE RIGAKU MICROMAX-007 HF -- -- --

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.2 100 79.0 0.095 0.095 -- 4.2 89220 70485 1.0 2.0 42.0
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
2.35 2.46 65.1 0.592 0.592 1.3 2.1 5717

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
MIR 2.35 30.0 1.0 -- 67610 62712 3327 92.76 -- 0.21517 0.21242 0.2677 RANDOM
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 2.35 2.411 -- 155 2883 0.304 0.402 -- 58.73
Temperature Factor Modeling
Temperature Factor Value
Isotropic Thermal Model ANISOTROPIC
Mean Isotropic B 43.927
Anisotropic B[1][1] 1.08
Anisotropic B[1][2] 0.0
Anisotropic B[1][3] 0.0
Anisotropic B[2][2] 0.2
Anisotropic B[2][3] 0.0
Anisotropic B[3][3] -1.28
RMS Deviations
Key Refinement Restraint Deviation
r_dihedral_angle_4_deg 17.216
r_angle_refined_deg 1.236
r_scbond_it 2.015
r_scangle_it 3.291
r_dihedral_angle_1_deg 5.478
r_gen_planes_refined 0.005
r_rigid_bond_restr 0.94
r_mcbond_it 0.714
r_dihedral_angle_2_deg 38.746
r_mcangle_it 1.34
r_chiral_restr 0.086
r_bond_refined_d 0.01
r_dihedral_angle_3_deg 16.315
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 6972
Nucleic Acid Atoms 0
Heterogen Atoms 145
Solvent Atoms 316

Software

Software
Software Name Purpose
ADSC data collection version: Quantum
SHELXS phasing
REFMAC refinement version: 5.5.0109
HKL-2000 data reduction
HKL-2000 data scaling