X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion Sitting Drop
pH 7
Temperature 289.0
Details 0.1M Tris:HCl, 15% (v/v) Ethanol, pH 7.0, VAPOR DIFFUSION, SITTING DROP, temperature 289K

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 68.1 α = 90
b = 68.1 β = 90
c = 124.52 γ = 120
Symmetry
Space Group P 31

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 100
Diffraction Detector
Detector Diffraction Type Details Collection Date
CCD ADSC QUANTUM 315r Mirror 2011-04-22
Diffraction Radiation
Monochromator Protocol
Si 111 crystal SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 19-ID 0.97923 APS 19-ID

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.48 30 99.9 0.084 -- -- 4.9 107855 107855 0.0 0.0 --
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1.48 1.52 99.9 0.565 -- 2.8 4.1 5291

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
SAD 1.48 29.487 -- 0.01 105018 105018 5254 97.29 0.1733 0.1733 0.1722 0.1937 random
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 1.4784 1.5313 -- 429 9222 0.2398 0.2404 -- 90.0
X Ray Diffraction 1.5313 1.5926 -- 484 9657 0.2085 0.2416 -- 94.0
X Ray Diffraction 1.5926 1.6651 -- 481 9850 0.1931 0.2226 -- 96.0
X Ray Diffraction 1.6651 1.7528 -- 532 9950 0.1795 0.2027 -- 97.0
X Ray Diffraction 1.7528 1.8627 -- 570 10011 0.1695 0.1887 -- 98.0
X Ray Diffraction 1.8627 2.0064 -- 548 10228 0.1713 0.1963 -- 99.0
X Ray Diffraction 2.0064 2.2083 -- 546 10213 0.1701 0.197 -- 100.0
X Ray Diffraction 2.2083 2.5277 -- 565 10264 0.1713 0.2028 -- 100.0
X Ray Diffraction 2.5277 3.184 -- 559 10221 0.1772 0.2001 -- 100.0
X Ray Diffraction 3.184 29.4932 -- 540 10148 0.1563 0.1695 -- 99.0
Temperature Factor Modeling
Temperature Factor Value
Anisotropic B[1][1] 0.3448
Anisotropic B[1][2] 0.0
Anisotropic B[1][3] 0.0
Anisotropic B[2][2] 0.3448
Anisotropic B[2][3] 0.0
Anisotropic B[3][3] -0.6896
RMS Deviations
Key Refinement Restraint Deviation
f_dihedral_angle_d 14.407
f_plane_restr 0.005
f_bond_d 0.007
f_chiral_restr 0.068
f_angle_d 1.076
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 4154
Nucleic Acid Atoms 0
Heterogen Atoms 24
Solvent Atoms 680

Software

Software
Software Name Purpose
SBC-Collect data collection
SHELXD phasing
MLPHARE phasing
DM model building
ARP model building
WARP model building
HKL-3000 phasing
PHENIX refinement version: (phenix.refine: 1.6.4_486)
HKL-3000 data reduction
HKL-3000 data scaling
DM phasing