X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion Hanging Drop
pH 7.3
Temperature 288.0
Details 0.2 M sodium phosphate monobasic, 20% PEG3350, pH 7.3, VAPOR DIFFUSION, HANGING DROP, temperature 288K

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 95.2 α = 90
b = 142.38 β = 90
c = 32.06 γ = 90
Symmetry
Space Group C 2 2 21

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 100
Diffraction Detector
Detector Diffraction Type Details Collection Date
CCD MARMOSAIC 300 mm CCD mirrors 2010-10-29
Diffraction Radiation
Monochromator Protocol
Si 111 CHANNEL SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 22-ID -- APS 22-ID

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.85 50 99.8 0.124 -- -- 3.7 18396 17866 3.0 3.0 21.0
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1.85 1.88 98.8 0.39 -- 4.9 3.0 --

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
MOLECULAR REPLACEMENT 1.866 30.973 -- 0.12 18396 17866 900 95.57 -- 0.1835 0.1825 0.2025 RANDOM
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 1.8663 1.9833 -- 142 2405 0.1804 0.2341 -- 83.0
X Ray Diffraction 1.9833 2.1364 -- 147 2787 0.176 0.2267 -- 96.0
X Ray Diffraction 2.1364 2.3513 -- 152 2802 0.1734 0.207 -- 97.0
X Ray Diffraction 2.3513 2.6913 -- 146 2902 0.1808 0.2191 -- 98.0
X Ray Diffraction 2.6913 3.3901 -- 170 2943 0.1815 0.2197 -- 100.0
X Ray Diffraction 3.3901 30.9776 -- 143 3127 0.1835 0.1702 -- 100.0
Temperature Factor Modeling
Temperature Factor Value
Anisotropic B[1][1] 4.1684
Anisotropic B[1][2] 0.0
Anisotropic B[1][3] 0.0
Anisotropic B[2][2] -2.0505
Anisotropic B[2][3] 0.0
Anisotropic B[3][3] -2.118
RMS Deviations
Key Refinement Restraint Deviation
f_chiral_restr 0.074
f_angle_d 1.113
f_dihedral_angle_d 15.121
f_bond_d 0.007
f_plane_restr 0.006
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 1295
Nucleic Acid Atoms 0
Heterogen Atoms 0
Solvent Atoms 151

Software

Software
Software Name Purpose
HKL-2000 data collection
PHASER phasing
PHENIX refinement version: (phenix.refine: 1.6_289)
autobuster refinement
HKL-2000 data reduction
HKL-2000 data scaling