X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion Hanging Drop
pH 7
Temperature 298.0
Details 0.25 M sodium formate, 16% w/v PEG3350, pH 7.0, VAPOR DIFFUSION, HANGING DROP, temperature 298K

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 82.98 α = 90
b = 101.99 β = 90
c = 155.77 γ = 90
Symmetry
Space Group C 2 2 21

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 100
Diffraction Detector
Detector Diffraction Type Details Collection Date
CCD MARMOSAIC 225 mm CCD -- 2011-02-05
Diffraction Radiation
Monochromator Protocol
double crystal - liquid nitrogen cooled SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 22-BM -- APS 22-BM

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.85 49.62 90.6 0.058 -- -- 5.8 52599 52598 0.0 2.0 --
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1.85 1.92 81.5 0.603 -- 2.47 5.6 4552

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
MOLECULAR REPLACEMENT 1.848 26.905 -- 0.0 51149 51149 1945 90.06 0.1961 0.1961 0.1949 0.2268 RANDOM
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 1.8481 1.9141 -- 146 3812 0.2705 0.2998 -- 71.0
X Ray Diffraction 1.9141 1.9907 -- 166 4226 0.2471 0.296 -- 78.0
X Ray Diffraction 1.9907 2.0813 -- 179 4492 0.2346 0.2786 -- 83.0
X Ray Diffraction 2.0813 2.191 -- 188 4694 0.2239 0.2861 -- 86.0
X Ray Diffraction 2.191 2.3281 -- 193 4879 0.2217 0.3004 -- 90.0
X Ray Diffraction 2.3281 2.5078 -- 205 5165 0.2165 0.2459 -- 95.0
X Ray Diffraction 2.5078 2.7599 -- 210 5317 0.2146 0.2516 -- 98.0
X Ray Diffraction 2.7599 3.1588 -- 215 5422 0.2042 0.2411 -- 99.0
X Ray Diffraction 3.1588 3.9776 -- 218 5512 0.1721 0.1906 -- 100.0
X Ray Diffraction 3.9776 26.9083 -- 225 5685 0.1597 0.1781 -- 100.0
Temperature Factor Modeling
Temperature Factor Value
Anisotropic B[1][1] 1.6064
Anisotropic B[1][2] 0.0
Anisotropic B[1][3] 0.0
Anisotropic B[2][2] 0.2848
Anisotropic B[2][3] 0.0
Anisotropic B[3][3] -1.4451
RMS Deviations
Key Refinement Restraint Deviation
f_chiral_restr 0.067
f_dihedral_angle_d 12.788
f_bond_d 0.007
f_angle_d 0.991
f_plane_restr 0.004
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 5078
Nucleic Acid Atoms 0
Heterogen Atoms 0
Solvent Atoms 388

Software

Software
Software Name Purpose
HKL-2000 data collection
PHASER phasing
PHENIX refinement version: (phenix.refine: 1.6.4_486)
HKL-2000 data reduction
HKL-2000 data scaling