X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion Sitting Drop
pH 7.9
Temperature 293.0
Details 9 % PEG-6000, 5% MPD, 0,1M HEPES, pH 7.9, VAPOR DIFFUSION, SITTING DROP, temperature 293K

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 105.19 α = 90
b = 187 β = 90
c = 300.17 γ = 90
Symmetry
Space Group I 2 2 2

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 100
Diffraction Detector
Detector Diffraction Type Details Collection Date
CCD MARMOSAIC 225 mm CCD -- 2006-12-19
Diffraction Radiation
Monochromator Protocol
-- SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON SLS BEAMLINE X06SA 0.9774 SLS X06SA

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
3.4 20 99.6 -- -- -- -- 40428 40428 2.0 2.0 --

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
SAD 3.4 19.997 -- 1.37 40428 40423 2020 98.84 -- 0.2602 0.2584 0.2952 --
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 3.4002 3.4848 -- 132 2676 0.3346 0.3817 -- 98.0
X Ray Diffraction 3.4848 3.5785 -- 151 2701 0.3055 0.3364 -- 100.0
X Ray Diffraction 3.5785 3.6832 -- 150 2746 0.2977 0.33 -- 100.0
X Ray Diffraction 3.6832 3.8013 -- 152 2710 0.2831 0.3327 -- 100.0
X Ray Diffraction 3.8013 3.9361 -- 121 2767 0.2697 0.3085 -- 100.0
X Ray Diffraction 3.9361 4.0925 -- 142 2749 0.2578 0.2718 -- 100.0
X Ray Diffraction 4.0925 4.277 -- 149 2731 0.2328 0.2844 -- 99.0
X Ray Diffraction 4.277 4.5 -- 170 2717 0.2313 0.268 -- 99.0
X Ray Diffraction 4.5 4.7784 -- 138 2763 0.2161 0.2655 -- 99.0
X Ray Diffraction 4.7784 5.1415 -- 127 2766 0.2154 0.2554 -- 99.0
X Ray Diffraction 5.1415 5.6483 -- 147 2764 0.2398 0.2878 -- 99.0
X Ray Diffraction 5.6483 6.4416 -- 146 2717 0.2654 0.3424 -- 97.0
X Ray Diffraction 6.4416 8.0275 -- 156 2763 0.271 0.3014 -- 98.0
X Ray Diffraction 8.0275 19.997 -- 139 2833 0.2667 0.2653 -- 97.0
Temperature Factor Modeling
Temperature Factor Value
Anisotropic B[1][1] -0.746
Anisotropic B[1][2] 0.0
Anisotropic B[1][3] 0.0
Anisotropic B[2][2] -6.9595
Anisotropic B[2][3] 0.0
Anisotropic B[3][3] 6.3619
RMS Deviations
Key Refinement Restraint Deviation
f_plane_restr 0.004
f_dihedral_angle_d 19.942
f_bond_d 0.018
f_chiral_restr 0.047
f_angle_d 0.872
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 11589
Nucleic Acid Atoms 0
Heterogen Atoms 12
Solvent Atoms 0

Software

Software
Software Name Purpose
SHARP phasing
PHENIX refinement version: (phenix.refine: 1.6.1_357)
XDS data reduction
XDS data scaling