X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion Hanging Drop
pH 5.5
Temperature 277.0
Details 14-19% PEG 3350, 0.1 M Bis-Tris pH 5.5, 0.15 M MgCl2, and 0.02% n-dodecyl- D-maltoside, VAPOR DIFFUSION, HANGING DROP, temperature 277K

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 58.7 α = 88.07
b = 89.96 β = 90.26
c = 122.64 γ = 68.78
Symmetry
Space Group P 1

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 100
Diffraction Detector
Detector Diffraction Type Details Collection Date
CCD MARMOSAIC 300 mm CCD -- 2009-11-02
Diffraction Radiation
Monochromator Protocol
diamond laue monochromator SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 21-ID-G 0.97856 APS 21-ID-G

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.7 30 95.5 0.064 0.064 -- 1.9 64625 61717 0.0 -3.0 --
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
2.7 2.75 95.8 0.451 0.451 1.6 1.9 --

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
MOLECULAR REPLACEMENT 2.7 29.599 -- 1.0 64191 57246 2897 89.18 -- 0.1943 0.1924 0.2286 --
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 2.7 2.7965 -- 247 4726 0.3085 0.388 -- 77.0
X Ray Diffraction 2.7965 2.9083 -- 278 4926 0.2803 0.3343 -- 81.0
X Ray Diffraction 2.9083 3.0406 -- 273 5102 0.2559 0.3457 -- 84.0
X Ray Diffraction 3.0406 3.2007 -- 260 5288 0.239 0.267 -- 87.0
X Ray Diffraction 3.2007 3.401 -- 307 5395 0.2136 0.2836 -- 88.0
X Ray Diffraction 3.401 3.6631 -- 308 5533 0.2006 0.2512 -- 91.0
X Ray Diffraction 3.6631 4.0309 -- 304 5632 0.1881 0.2455 -- 93.0
X Ray Diffraction 4.0309 4.6123 -- 303 5826 0.1537 0.1785 -- 95.0
X Ray Diffraction 4.6123 5.8038 -- 309 5963 0.1582 0.1843 -- 98.0
X Ray Diffraction 5.8038 29.6007 -- 308 5958 0.1754 0.1771 -- 98.0
Temperature Factor Modeling
Temperature Factor Value
Anisotropic B[1][1] 11.1488
Anisotropic B[1][2] 6.3631
Anisotropic B[1][3] -1.1873
Anisotropic B[2][2] 8.4486
Anisotropic B[2][3] 3.6521
Anisotropic B[3][3] -19.5974
RMS Deviations
Key Refinement Restraint Deviation
f_chiral_restr 0.075
f_plane_restr 0.004
f_bond_d 0.008
f_dihedral_angle_d 17.104
f_angle_d 1.198
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 15565
Nucleic Acid Atoms 0
Heterogen Atoms 128
Solvent Atoms 113

Software

Software
Software Name Purpose
HKL-2000 data collection
PHASER phasing
PHENIX refinement version: (phenix.refine: 1.6.4_486)
HKL-2000 data reduction
HKL-2000 data scaling