X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion Sitting Drop
pH 8
Temperature 289.0
Details 0.1M imidazole:HCl, 2.5M Sodium Chloride, pH 8.0, VAPOR DIFFUSION, SITTING DROP, temperature 289K

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 143.09 α = 90
b = 143.09 β = 90
c = 129.61 γ = 90
Symmetry
Space Group I 4 2 2

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 100
Diffraction Detector
Detector Diffraction Type Details Collection Date
CCD ADSC QUANTUM 315r mirror 2010-10-13
Diffraction Radiation
Monochromator Protocol
Si 111 crystal SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 19-ID 0.97942 APS 19-ID

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.9 45.3 99.9 0.112 -- -- 12.0 52988 52988 0.0 0.0 29.41
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1.9 1.93 100.0 0.728 -- 3.6 12.0 2621

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
SAD 1.899 45.247 0.0 0.0 51937 51937 2646 97.83 0.1565 0.1565 0.1557 0.1713 random
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 1.8985 1.9664 -- 244 4546 0.21 0.2474 -- 91.0
X Ray Diffraction 1.9664 2.0451 -- 267 4723 0.1744 0.2164 -- 95.0
X Ray Diffraction 2.0451 2.1382 -- 254 4814 0.1478 0.1801 -- 97.0
X Ray Diffraction 2.1382 2.2509 -- 284 4872 0.1434 0.1704 -- 98.0
X Ray Diffraction 2.2509 2.392 -- 265 4951 0.1478 0.1827 -- 99.0
X Ray Diffraction 2.392 2.5766 -- 247 4996 0.157 0.1736 -- 99.0
X Ray Diffraction 2.5766 2.8359 -- 274 5005 0.1695 0.1818 -- 100.0
X Ray Diffraction 2.8359 3.2461 -- 261 5062 0.1763 0.1918 -- 100.0
X Ray Diffraction 3.2461 4.0894 -- 287 5069 0.1491 0.1535 -- 100.0
X Ray Diffraction 4.0894 45.2603 -- 263 5253 0.1426 0.1527 -- 99.0
Temperature Factor Modeling
Temperature Factor Value
Anisotropic B[1][1] 0.452
Anisotropic B[1][2] 0.0
Anisotropic B[1][3] 0.0
Anisotropic B[2][2] 0.452
Anisotropic B[2][3] 0.0
Anisotropic B[3][3] -0.904
RMS Deviations
Key Refinement Restraint Deviation
f_plane_restr 0.004
f_angle_d 0.944
f_bond_d 0.007
f_dihedral_angle_d 14.661
f_chiral_restr 0.068
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 3104
Nucleic Acid Atoms 0
Heterogen Atoms 29
Solvent Atoms 341

Software

Software
Software Name Purpose
SBC-Collect data collection
SHELXD phasing
MLPHARE phasing
DM model building
ARP model building
WARP model building
HKL-3000 phasing
PHENIX refinement version: (phenix.refine: 1.6.4_486)
HKL-3000 data reduction
HKL-3000 data scaling
DM phasing