X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion Hanging Drop
pH 7.5
Temperature 293.0
Details 0.1M Hepes, 20% PEG4000, 0.2M ammonium sulfate, pH 7.5, VAPOR DIFFUSION, HANGING DROP, temperature 293K

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 77.94 α = 90
b = 77.94 β = 90
c = 137.55 γ = 120
Symmetry
Space Group P 32

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 173
Diffraction Detector
Detector Diffraction Type Details Collection Date
CCD ADSC QUANTUM 4 -- 2002-07-02
Diffraction Radiation
Monochromator Protocol
KOHZU DOUBLE CRYSTAL SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON NSLS BEAMLINE X4A 1.277 NSLS X4A

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.2 30 99.3 -- 0.048 -- 3.5 47189 47189 0.0 0.0 --
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
2.2 2.28 99.6 -- 0.265 5.9 3.4 4732

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
MOLECULAR REPLACEMENT 2.2 25.0 0.0 0.0 45665 45665 2287 -- -- -- 0.262 0.294 RANDOM
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 2.2 2.22 958 41 -- 0.36 0.46 -- --
X Ray Diffraction 2.22 2.23 856 42 -- 0.38 0.4 -- --
X Ray Diffraction 2.23 2.25 952 49 -- 0.35 0.34 -- --
X Ray Diffraction 2.25 2.27 858 39 -- 0.36 0.42 -- --
X Ray Diffraction 2.27 2.29 979 50 -- 0.36 0.4 -- --
X Ray Diffraction 2.29 2.31 870 42 -- 0.35 0.37 -- --
X Ray Diffraction 2.31 2.33 950 44 -- 0.35 0.44 -- --
X Ray Diffraction 2.33 2.35 967 42 -- 0.35 0.33 -- --
X Ray Diffraction 2.35 2.37 952 53 -- 0.35 0.38 -- --
Temperature Factor Modeling
Temperature Factor Value
Anisotropic B[1][1] -3.633
Anisotropic B[1][2] -5.551
Anisotropic B[1][3] 0.0
Anisotropic B[2][2] -3.633
Anisotropic B[2][3] 0.0
Anisotropic B[3][3] 7.265
RMS Deviations
Key Refinement Restraint Deviation
c_improper_angle_d 0.82
c_bond_d 0.008
c_angle_deg 1.42
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 5372
Nucleic Acid Atoms 0
Heterogen Atoms 25
Solvent Atoms 126

Software

Software
Software Name Purpose
HKL-2000 data collection
AMoRE phasing
CNS refinement version: 1.1
HKL-2000 data reduction
HKL-2000 data scaling