X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion Sitting Drop
pH 6.86
Temperature 277.0
Details 1.7100M ammonium sulfate, 10.0000% Dioxane, 0.1M MES pH 6.86, VAPOR DIFFUSION,SITTING DROP,NANODROP, temperature 277K, VAPOR DIFFUSION, SITTING DROP

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 137.24 α = 90
b = 137.24 β = 90
c = 54.72 γ = 120
Symmetry
Space Group P 32 2 1

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 100
Diffraction Detector
Detector Diffraction Type Details Collection Date
CCD MARMOSAIC 325 mm CCD Flat mirror (vertical focusing) 2010-02-11
Diffraction Radiation
Monochromator Protocol
Single crystal Si(111) bent monochromator (horizontal focusing) MAD
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON SSRL BEAMLINE BL11-1 0.91837,0.97959,0.97925 SSRL BL11-1

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.96 29.71 99.7 0.056 -- -- -- -- 12584 -- -3.0 99.731
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
2.97 3.08 99.8 0.743 -- 1.8 -- --

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
MAD 2.96 29.713 -- 0.0 -- 12572 609 -- -- 0.2016 0.2007 0.2219 RANDOM
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 2.96 3.24 -- 141 2826 0.2426 0.2692 -- --
Temperature Factor Modeling
Temperature Factor Value
Mean Isotropic B 97.8883
Anisotropic B[1][1] 3.7305
Anisotropic B[1][2] 0.0
Anisotropic B[1][3] 0.0
Anisotropic B[2][2] 3.7305
Anisotropic B[2][3] 0.0
Anisotropic B[3][3] -7.461
RMS Deviations
Key Refinement Restraint Deviation
t_angle_deg 0.32
t_bond_d 0.01
t_omega_torsion 2.78
t_other_torsion 13.63
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 3165
Nucleic Acid Atoms 0
Heterogen Atoms 40
Solvent Atoms 0

Software

Software
Software Name Purpose
SHELX phasing
BUSTER-TNT refinement version: BUSTER 2.8.0
XSCALE data processing
PDB_EXTRACT data extraction version: 3.10
XDS data reduction
XSCALE data scaling
autoSHARP phasing
BUSTER refinement version: 2.8.0