X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion Sitting Drop
pH 5.5
Temperature 277.0
Details 40.000000000% PEG-600, 0.1M Citrate pH 5.5, VAPOR DIFFUSION,SITTING DROP,NANODROP, temperature 277K, VAPOR DIFFUSION, SITTING DROP

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 46.17 α = 90
b = 63.8 β = 90
c = 105.6 γ = 90
Symmetry
Space Group P 21 21 21

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 100
Diffraction Detector
Detector Diffraction Type Details Collection Date
CCD MARMOSAIC 325 mm CCD Flat mirror (vertical focusing) 2010-04-08
Diffraction Radiation
Monochromator Protocol
Single crystal Si(111) bent monochromator (horizontal focusing) MAD
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON SSRL BEAMLINE BL11-1 0.91837,0.97941,0.97894 SSRL BL11-1

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.35 27.99 97.7 0.058 -- -- -- -- 68533 -- -3.0 10.556
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1.35 1.4 95.2 0.505 -- 1.9 -- --

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
MAD 1.35 27.993 -- 0.0 -- 68472 3466 98.8 -- 0.1475 0.1468 0.1595 RANDOM
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 1.35 1.385 -- 241 4702 0.254 0.253 -- 97.02
Temperature Factor Modeling
Temperature Factor Value
Mean Isotropic B 14.9537
Anisotropic B[1][1] 0.49
Anisotropic B[1][2] 0.0
Anisotropic B[1][3] 0.0
Anisotropic B[2][2] -0.28
Anisotropic B[2][3] 0.0
Anisotropic B[3][3] -0.21
RMS Deviations
Key Refinement Restraint Deviation
r_dihedral_angle_1_deg 7.036
r_gen_planes_refined 0.008
r_scangle_it 6.154
r_dihedral_angle_2_deg 33.602
r_angle_other_deg 0.912
r_bond_refined_d 0.016
r_chiral_restr 0.103
r_angle_refined_deg 1.617
r_mcbond_it 1.544
r_mcbond_other 0.388
r_bond_other_d 0.001
r_gen_planes_other 0.002
r_mcangle_it 2.631
r_dihedral_angle_3_deg 11.365
r_dihedral_angle_4_deg 21.71
r_scbond_it 3.874
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 2105
Nucleic Acid Atoms 0
Heterogen Atoms 28
Solvent Atoms 368

Software

Software
Software Name Purpose
SHELX phasing
REFMAC refinement version: 5.5.0110
XSCALE data scaling
PDB_EXTRACT data extraction version: 3.10
XDS data reduction
SHELXD phasing
autoSHARP phasing