X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion Hanging Drop
pH 8.5
Temperature 291.0
Details 16 % w/v PEG 8000, 0.1 M Tris, pH 8.5, VAPOR DIFFUSION, HANGING DROP, temperature 291K

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 81.31 α = 90
b = 81.31 β = 90
c = 135.49 γ = 120
Symmetry
Space Group P 31 2 1

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 95
Diffraction Detector
Detector Diffraction Type Details Collection Date
CCD MARMOSAIC 300 mm CCD -- 2009-07-11
Diffraction Radiation
Monochromator Protocol
diamond SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 21-ID-D 1.078 APS 21-ID-D

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.7 50 100.0 -- 0.071 -- 14.1 -- 57817 1.0 -- 16.28

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
MOLECULAR REPLACEMENT 1.7 38.94 -- 1.0 -- 56757 2881 98.18 -- 0.1713 0.17 0.1953 random
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 1.6986 1.7593 -- 272 5095 0.1644 0.1952 -- 94.0
X Ray Diffraction 1.7593 1.8297 -- 268 5218 0.1622 0.1863 -- 96.0
X Ray Diffraction 1.8297 1.913 -- 297 5233 0.1683 0.2085 -- 97.0
X Ray Diffraction 1.913 2.0139 -- 294 5345 0.163 0.2101 -- 98.0
X Ray Diffraction 2.0139 2.14 -- 287 5383 0.1574 0.1986 -- 99.0
X Ray Diffraction 2.14 2.3053 -- 279 5398 0.1567 0.1869 -- 99.0
X Ray Diffraction 2.3053 2.5372 -- 303 5423 0.1646 0.1868 -- 99.0
X Ray Diffraction 2.5372 2.9042 -- 277 5500 0.1649 0.1785 -- 99.0
X Ray Diffraction 2.9042 3.6586 -- 282 5545 0.1763 0.2064 -- 100.0
X Ray Diffraction 3.6586 38.9499 -- 322 5736 0.1773 0.1917 -- 100.0
Temperature Factor Modeling
Temperature Factor Value
Anisotropic B[1][1] 1.2713
Anisotropic B[1][2] 0.0
Anisotropic B[1][3] 0.0
Anisotropic B[2][2] 1.2713
Anisotropic B[2][3] 0.0
Anisotropic B[3][3] -2.5426
RMS Deviations
Key Refinement Restraint Deviation
f_chiral_restr 0.073
f_bond_d 0.006
f_angle_d 1.005
f_dihedral_angle_d 13.677
f_plane_restr 0.004
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 3454
Nucleic Acid Atoms 0
Heterogen Atoms 32
Solvent Atoms 328

Software

Software
Software Name Purpose
EPMR phasing
PHENIX refinement version: (phenix.refine: 1.5_2)
HKL-2000 data reduction
HKL-2000 data scaling