X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion Sitting Drop
pH 7.5
Temperature 288.0
Details 50 mM Tris/HCl, 50 % DMSO, 1.8 M CsCl, pH 7.5, VAPOR DIFFUSION, SITTING DROP, temperature 288K

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 93.09 α = 90
b = 93.09 β = 90
c = 129.15 γ = 120
Symmetry
Space Group P 61 2 2

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 100
Diffraction Detector
Detector Diffraction Type Details Collection Date
IMAGE PLATE MAR scanner 345 mm plate mirrors 2010-03-23
Diffraction Radiation
Monochromator Protocol
-- SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SEALED TUBE OTHER 1.5418 -- --

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.97 25 96.1 -- 0.091 -- 7.3 21974 21974 0.0 0.0 --
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1.97 2.0 98.3 -- 0.472 3.9 6.5 1143

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
FOURIER SYNTHESIS 1.97 10.0 -- 0.0 21974 21974 2167 92.4 0.176 0.176 0.164 0.231 RANDOM
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 1.97 2.0 21974 -- -- -- -- -- --
RMS Deviations
Key Refinement Restraint Deviation
s_bond_d 0.005
s_rigid_bond_adp_cmpnt 0.0
s_non_zero_chiral_vol 0.031
s_angle_d 0.021
s_similar_dist 0.0
s_anti_bump_dis_restr 0.009
s_similar_adp_cmpnt 0.062
s_from_restr_planes 0.023
s_approx_iso_adps 0.0
s_zero_chiral_vol 0.028
Coordinate Error
Parameter Value
Number Disordered Residues 2.0
Occupancy Sum Hydrogen 2246.0
Occupancy Sum Non Hydrogen 2620.47
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 2416
Nucleic Acid Atoms 0
Heterogen Atoms 22
Solvent Atoms 188

Software

Software
Software Name Purpose
SHELXL-97 refinement
CNS refinement
MAR345dtb data collection
HKL-2000 data reduction
HKL-2000 data scaling
CNS phasing