X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion Hanging Drop
pH 8
Temperature 277.0
Details 2.1M Ammonium Sulfate, 6%(v/v) iso-propanol, pH 8.0, VAPOR DIFFUSION, HANGING DROP, temperature 277K

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 102.36 α = 90
b = 102.36 β = 90
c = 107.33 γ = 90
Symmetry
Space Group P 43

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 100
Diffraction Detector
Detector Diffraction Type Details Collection Date
IMAGE PLATE RIGAKU RAXIS IV++ -- 2009-01-03
Diffraction Radiation
Monochromator Protocol
-- SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
ROTATING ANODE RIGAKU MICROMAX-007 1.5418 -- --

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.6 50 -- 0.0845 -- -- -- -- 30968 -- -- --
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
2.598 2.69 99.0 0.0845 -- -- -- 14663

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
MOLECULAR REPLACEMENT 2.598 25.443 -- 0.08 -- 30968 1636 90.72 -- 0.232 0.226 0.256 random
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 2.602 2.686 -- 134 2501 0.418 0.366 -- 81.0
X Ray Diffraction 2.686 2.782 -- 148 2534 0.348 0.365 -- 83.0
X Ray Diffraction 2.782 2.893 -- 141 2557 0.329 0.358 -- 84.0
X Ray Diffraction 2.893 3.024 -- 143 2632 0.301 0.279 -- 85.0
X Ray Diffraction 3.024 3.183 -- 157 2629 0.269 0.291 -- 86.0
X Ray Diffraction 3.183 3.382 -- 141 2707 0.247 0.253 -- 88.0
X Ray Diffraction 3.382 3.642 -- 138 2736 0.215 0.239 -- 89.0
X Ray Diffraction 3.642 4.006 -- 142 2725 0.194 0.237 -- 87.0
X Ray Diffraction 4.006 4.581 -- 134 2633 0.183 0.211 -- 86.0
X Ray Diffraction 4.581 5.752 -- 143 2791 0.186 0.26 -- 90.0
X Ray Diffraction 5.752 21.054 -- 159 2892 0.21 0.252 -- 92.0
Temperature Factor Modeling
Temperature Factor Value
Mean Isotropic B 58.093
Anisotropic B[1][1] 0.179
Anisotropic B[1][2] 0.0
Anisotropic B[1][3] 0.0
Anisotropic B[2][2] 0.179
Anisotropic B[2][3] 0.0
Anisotropic B[3][3] -0.358
RMS Deviations
Key Refinement Restraint Deviation
f_plane_restr 0.002
f_bond_d 0.003
f_angle_d 0.61
f_chiral_restr 0.044
f_dihedral_angle_d 17.007
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 6579
Nucleic Acid Atoms 0
Heterogen Atoms 3
Solvent Atoms 244

Software

Software
Software Name Purpose
HKL-2000 data collection
PHENIX refinement version: (phenix.refine: 1.5_2)
MOSFLM data reduction
SCALA data scaling