X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion Hanging Drop
Details VAPOR DIFFUSION, HANGING DROP
Method Vapor Diffusion Hanging Drop
Details VAPOR DIFFUSION, HANGING DROP
Method Vapor Diffusion Hanging Drop
Details VAPOR DIFFUSION, HANGING DROP
Method Vapor Diffusion Hanging Drop
Details VAPOR DIFFUSION, HANGING DROP
Method Vapor Diffusion Hanging Drop
Details VAPOR DIFFUSION, HANGING DROP

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 186.84 α = 90
b = 64.33 β = 90
c = 83.36 γ = 90
Symmetry
Space Group P 21 21 2

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 100
Diffraction Radiation
Monochromator Protocol
GRAPHITE SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 22-ID 1.5418 APS 22-ID

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.5 50 96.8 -- 0.135 -- 11.8 -- 34570 -- -- --
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
2.5 2.59 81.1 -- 0.645 -- 5.7 2852

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
MOLECULAR REPLACEMENT 2.499 34.639 -- 1.89 -- 34408 1725 51.18 -- 0.2039 0.2017 0.2453 --
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 2.4991 2.5726 -- 102 2204 0.3178 0.3652 -- 41.0
X Ray Diffraction 2.5726 2.6556 -- 128 2421 0.3143 0.4053 -- 45.0
X Ray Diffraction 2.6556 2.7505 -- 134 2616 0.3153 0.3712 -- 49.0
X Ray Diffraction 2.7505 2.8605 -- 148 2732 0.308 0.3878 -- 52.0
X Ray Diffraction 2.8605 2.9906 -- 143 2791 0.293 0.3791 -- 52.0
X Ray Diffraction 2.9906 3.1482 -- 134 2789 0.261 0.3298 -- 52.0
X Ray Diffraction 3.1482 3.3453 -- 156 2810 0.2403 0.2922 -- 53.0
X Ray Diffraction 3.3453 3.6034 -- 150 2804 0.2022 0.2782 -- 53.0
X Ray Diffraction 3.6034 3.9655 -- 165 2807 0.1683 0.2312 -- 53.0
X Ray Diffraction 3.9655 4.5383 -- 152 2827 0.1388 0.2001 -- 53.0
X Ray Diffraction 4.5383 5.7136 -- 156 2859 0.1432 0.1707 -- 54.0
X Ray Diffraction 5.7136 34.6425 -- 157 3023 0.1947 0.2085 -- 56.0
Temperature Factor Modeling
Temperature Factor Value
Anisotropic B[1][1] 12.1318
Anisotropic B[1][2] 0.0
Anisotropic B[1][3] 0.0
Anisotropic B[2][2] -9.2505
Anisotropic B[2][3] 0.0
Anisotropic B[3][3] -11.326
RMS Deviations
Key Refinement Restraint Deviation
f_dihedral_angle_d 22.58
f_angle_d 1.241
f_chiral_restr 0.072
f_plane_restr 0.004
f_bond_d 0.008
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 3881
Nucleic Acid Atoms 1470
Heterogen Atoms 1
Solvent Atoms 9

Software

Software
Software Name Purpose
HKL-2000 data collection
MOLREP phasing
PHENIX refinement version: (phenix.refine)
HKL-2000 data reduction
HKL-2000 data scaling