X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion Sitting Drop
pH 6.2
Temperature 291.0
Details 0.2 M sodium Chloride 0.1M Na/K phosphate 50% PEG200, pH 6.2, VAPOR DIFFUSION, SITTING DROP, temperature 291K

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 43.64 α = 90
b = 43.64 β = 90
c = 127.76 γ = 120
Symmetry
Space Group P 32 2 1

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 100
Diffraction Detector
Detector Diffraction Type Details Collection Date
CCD ADSC QUANTUM 315r mirrors 2009-02-28
Diffraction Radiation
Monochromator Protocol
double crystal SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 19-ID 0.9794 APS 19-ID

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.3 40 98.7 0.086 -- -- 6.7 6540 6532 2.0 2.0 68.3
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
2.3 2.34 99.4 0.355 -- 6.3 6.4 320

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
SAD 2.4 40.0 2.0 2.0 5912 5641 271 99.09 0.21 0.20423 0.20136 0.26241 RANDOM
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 2.401 2.463 -- 19 404 0.174 0.163 -- 98.83
Temperature Factor Modeling
Temperature Factor Value
Mean Isotropic B 28.37
Anisotropic B[1][1] -0.61
Anisotropic B[1][2] -0.3
Anisotropic B[1][3] 0.0
Anisotropic B[2][2] -0.61
Anisotropic B[2][3] 0.0
Anisotropic B[3][3] 0.91
RMS Deviations
Key Refinement Restraint Deviation
r_scbond_it 2.456
r_chiral_restr 0.091
r_angle_other_deg 0.958
r_dihedral_angle_2_deg 31.053
r_mcbond_other 0.158
r_bond_other_d 0.001
r_gen_planes_other 0.001
r_mcangle_it 1.521
r_scangle_it 4.099
r_mcbond_it 0.76
r_bond_refined_d 0.019
r_dihedral_angle_4_deg 24.169
r_dihedral_angle_3_deg 17.721
r_dihedral_angle_1_deg 6.243
r_gen_planes_refined 0.006
r_angle_refined_deg 1.638
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 1037
Nucleic Acid Atoms 0
Heterogen Atoms 5
Solvent Atoms 13

Software

Software
Software Name Purpose
SBC-Collect data collection
HKL-3000 phasing
DM model building
SHELX model building
MLPHARE phasing
Coot model building
ARP/wARP model building
REFMAC refinement version: 5.5.0102
HKL-3000 data reduction
HKL-3000 data scaling
DM phasing
SHELX phasing