ELECTRON MICROSCOPY Experimental Data



EM Sample
Sample Vitrification Details --
Sample Aggregation State PARTICLE
Sample Reconstruction Method SINGLE PARTICLE
Name of Sample Mm-cpn with 1mM ATP/AlFx
EM Data Acquisition
Date of Experiment --
Temperature (Kelvin) 100.0
Microscope Model JEOL 3200FSC
Detector Type GATAN ULTRASCAN 4000 (4k x 4k)
Minimum Defocus (nm) 1000.0
Maximum Defocus (nm) 3000.0
Minimum Tilt Angle (degrees) 0.0
Maximum Tilt Angle (degrees) 0.0
Nominal CS 4.1
Imaging Mode BRIGHT FIELD
Electron Dose (electrons per Å**-2) 20.0
Illumination Mode FLOOD BEAM
Nominal Magnification 80000
Calibrated Magnification 112000
Source FIELD EMISSION GUN
Acceleration Voltage (kV) 300
Imaging Details --
3D Reconstruction
Software Package(s) EMAN
Reconstruction Method(s) --
EM Image Reconstruction Statistics
Number of Particles --
Other Details THE SINGLE SUBUNIT MODEL OF MM-CPN WAS MANUALLY BUILT IN THE CRYO-EM DENSITY USING COOT. THE ENTIRE 16-SUBUNIT COMPLEX WAS GENERATED BASED ON THE D8 SYMMETRY.
Effective Resolution 4.3
EM Map-Model Fitting and Refinement
Refinement Space Refinement Protocol Refinement Target Overall B Value Fitting Procedure Fitting Software
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