X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion Sitting Drop
pH 7.5
Temperature 298.0
Details 0.1M HEPES, 10% PEG8000, 8% Ethylene glycol, pH 7.5, VAPOR DIFFUSION, SITTING DROP, temperature 298K

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 53.13 α = 90
b = 78.49 β = 104.65
c = 64.06 γ = 90
Symmetry
Space Group P 1 21 1

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 100
Diffraction Detector
Detector Diffraction Type Details Collection Date
CCD ADSC QUANTUM 315r -- 2009-12-17
Diffraction Radiation
Monochromator Protocol
Si(111) double crystal SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 19-ID 0.97901 APS 19-ID

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.8 50 99.9 0.999 -- -- 5.0 47224 47195 -- -3.0 21.3
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1.8 1.83 99.7 0.665 -- 2.36 4.6 2387

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
SAD 1.8 50.0 -- 0.0 47123 47123 2381 99.76 0.18289 0.18289 0.1815 0.20863 RANDOM
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 1.8 1.846 3425 167 3258 0.275 0.298 -- 98.56
Temperature Factor Modeling
Temperature Factor Value
Mean Isotropic B 16.297
Anisotropic B[1][1] 1.22
Anisotropic B[1][2] 0.0
Anisotropic B[1][3] -1.13
Anisotropic B[2][2] -0.76
Anisotropic B[2][3] 0.0
Anisotropic B[3][3] -1.03
RMS Deviations
Key Refinement Restraint Deviation
r_dihedral_angle_3_deg 12.719
r_chiral_restr 0.108
r_dihedral_angle_1_deg 5.85
r_bond_refined_d 0.014
r_mcbond_it 0.762
r_scangle_it 3.584
r_scbond_it 2.17
r_angle_refined_deg 1.541
r_dihedral_angle_4_deg 14.972
r_mcangle_it 1.354
r_dihedral_angle_2_deg 32.338
r_gen_planes_refined 0.008
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 3159
Nucleic Acid Atoms 0
Heterogen Atoms 31
Solvent Atoms 357

Software

Software
Software Name Purpose
SBC-Collect data collection
HKL-3000 phasing
SHELXD phasing
SHELXE model building
MLPHARE phasing
DM model building
RESOLVE model building
Coot model building
ARP/wARP model building
REFMAC refinement version: 5.5.0102
HKL-3000 data reduction
HKL-3000 data scaling
DM phasing
RESOLVE phasing