X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion Hanging Drop
pH 4
Temperature 298.0
Details 2.5M NH4 Sulfate, VAPOR DIFFUSION, HANGING DROP, temperature 298K

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 67.82 α = 90
b = 67.82 β = 90
c = 155.17 γ = 120
Symmetry
Space Group P 65 2 2

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 100
2 100
Diffraction Detector
Detector Diffraction Type Details Collection Date
CCD RAYONIX MX-300 Mirrors 2009-12-10
CCD RAYONIX MX-300 Mirrors 2009-11-12
Diffraction Radiation
Monochromator Protocol
Si 111 SINGLE WAVELENGTH
Si 111 SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 21-ID-D 0.97857 APS 21-ID-D
SYNCHROTRON APS BEAMLINE 21-ID-D 0.77487 APS 21-ID-D

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.5 30 99.9 0.05 -- -- 9.9 34751 34751 -3.0 -3.0 --
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1.5 1.53 99.7 0.646 -- 2.57 7.6 1689

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
SAD 1.5 23.415 -- 0.0 33512 33512 2571 96.52 0.1733 0.1692 0.1692 0.2222 RANDOM
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 1.4992 1.5528 -- 210 2834 0.1802 0.2488 -- 90.0
X Ray Diffraction 1.5528 1.615 -- 222 2909 0.1661 0.2677 -- 92.0
X Ray Diffraction 1.615 1.6884 -- 239 2959 0.1534 0.2389 -- 94.0
X Ray Diffraction 1.6884 1.7774 -- 261 3017 0.1428 0.2003 -- 96.0
X Ray Diffraction 1.7774 1.8888 -- 278 3042 0.1486 0.2282 -- 97.0
X Ray Diffraction 1.8888 2.0345 -- 279 3090 0.1442 0.2067 -- 99.0
X Ray Diffraction 2.0345 2.2391 -- 255 3179 0.1469 0.2075 -- 99.0
X Ray Diffraction 2.2391 2.5628 -- 270 3202 0.1563 0.2158 -- 99.0
X Ray Diffraction 2.5628 3.2275 -- 260 3270 0.1764 0.2336 -- 100.0
X Ray Diffraction 3.2275 23.4173 -- 297 3439 0.1797 0.2135 -- 99.0
Temperature Factor Modeling
Temperature Factor Value
Isotropic Thermal Model Ansiotropic
Anisotropic B[1][1] -0.1387
Anisotropic B[1][2] 0.0
Anisotropic B[1][3] 0.0
Anisotropic B[2][2] 0.0
Anisotropic B[2][3] -0.1387
Anisotropic B[3][3] 0.2774
RMS Deviations
Key Refinement Restraint Deviation
f_dihedral_angle_d 16.341
f_plane_restr 0.005
f_angle_d 0.983
f_chiral_restr 0.07
f_bond_d 0.005
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 1589
Nucleic Acid Atoms 0
Heterogen Atoms 10
Solvent Atoms 185

Software

Software
Software Name Purpose
BLU-MAX data collection
PHENIX model building version: (phenix.autosol)
PHENIX refinement version: (phenix.refine: 1.4_115)
HKL-2000 data reduction
HKL-2000 data scaling
PHENIX phasing