X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion Hanging Drop
pH 5.5
Temperature 293.0
Details 30% PEG 600, 0.1 M bis-tris buffer, 0.1M MgSO4, 0.4mM DDM, 5% ethylene glycole, pH 5.5, VAPOR DIFFUSION, HANGING DROP, temperature 293K

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 150.08 α = 90
b = 150.08 β = 90
c = 81.68 γ = 120
Symmetry
Space Group P 62 2 2

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 100
Diffraction Detector
Detector Diffraction Type Details Collection Date
CCD MARMOSAIC 325 mm CCD -- 2009-05-01
Diffraction Radiation
Monochromator Protocol
-- SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON SSRL BEAMLINE BL9-2 0.97946 SSRL BL9-2

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.05 50 98.1 0.058 0.058 -- 6.6 -- 33814 0.0 0.0 39.1
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
2.05 2.12 85.5 0.814 0.814 1.55 3.8 3367

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
MOLECULAR REPLACEMENT 2.05 34.578 -- 1.35 -- 33789 1708 98.15 -- 0.1868 0.1845 0.2312 --
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 2.05 2.1108 -- 133 2249 0.2818 0.3215 -- 84.0
X Ray Diffraction 2.1108 2.1789 -- 150 2485 0.2563 0.2901 -- 94.0
X Ray Diffraction 2.1789 2.2568 -- 138 2662 0.2331 0.2861 -- 100.0
X Ray Diffraction 2.2568 2.3471 -- 141 2702 0.209 0.2697 -- 100.0
X Ray Diffraction 2.3471 2.4539 -- 144 2675 0.198 0.2599 -- 100.0
X Ray Diffraction 2.4539 2.5833 -- 132 2708 0.1978 0.285 -- 100.0
X Ray Diffraction 2.5833 2.745 -- 146 2690 0.203 0.2753 -- 100.0
X Ray Diffraction 2.745 2.9569 -- 169 2698 0.1958 0.2629 -- 100.0
X Ray Diffraction 2.9569 3.2542 -- 128 2741 0.1885 0.2369 -- 100.0
X Ray Diffraction 3.2542 3.7247 -- 137 2753 0.1676 0.2225 -- 100.0
X Ray Diffraction 3.7247 4.6908 -- 147 2765 0.1431 0.1695 -- 100.0
X Ray Diffraction 4.6908 34.5833 -- 143 2953 0.1666 0.1938 -- 100.0
RMS Deviations
Key Refinement Restraint Deviation
f_chiral_restr 0.083
f_angle_d 1.183
f_bond_d 0.007
f_dihedral_angle_d 20.218
f_plane_restr 0.005
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 3200
Nucleic Acid Atoms 0
Heterogen Atoms 95
Solvent Atoms 299

Software

Software
Software Name Purpose
PHASER phasing
PHENIX refinement version: (phenix.refine: 1.4_4)
HKL-2000 data reduction
HKL-2000 data scaling