X-RAY DIFFRACTION Experimental Data & Validation

X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion Sitting Drop
pH 4.2
Temperature 289.0
Details 0.1M Phosphate-citrate, 1.6M NaH2PO4 /0.4M K2HPO4, pH 4.2, VAPOR DIFFUSION, SITTING DROP, temperature 289K

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 75.36 α = 90
b = 75.36 β = 90
c = 75.02 γ = 120
Symmetry
Space Group P 32 2 1

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 100
Diffraction Detector
Detector Diffraction Type Details Collection Date
CCD ADSC QUANTUM 315r Mirror 2009-08-16
Diffraction Radiation
Monochromator Protocol
Si 111 crystal SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 19-ID 0.97942 APS 19-ID

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.88 38 98.8 0.094 -- -- 5.4 20202 20202 0.0 0.0 --
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1.88 1.91 86.3 0.541 -- 2.3 3.8 854

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
SAD 1.881 37.68 0.0 0.0 19520 19520 982 95.62 0.1662 0.1662 0.1634 0.2201 RANDOM
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 1.8813 1.9805 -- 117 2240 0.1906 0.2472 -- 82.0
X Ray Diffraction 1.9805 2.1045 -- 142 2573 0.1625 0.2146 -- 95.0
X Ray Diffraction 2.1045 2.267 -- 140 2655 0.1448 0.2118 -- 96.0
X Ray Diffraction 2.267 2.4951 -- 157 2669 0.1557 0.2184 -- 98.0
X Ray Diffraction 2.4951 2.856 -- 149 2718 0.1611 0.226 -- 99.0
X Ray Diffraction 2.856 3.5979 -- 121 2793 0.1572 0.2468 -- 99.0
X Ray Diffraction 3.5979 37.688 -- 156 2890 0.1705 0.1998 -- 100.0
RMS Deviations
Key Refinement Restraint Deviation
f_plane_restr 0.003
f_angle_d 0.876
f_dihedral_angle_d 18.157
f_chiral_restr 0.056
f_bond_d 0.006
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 2006
Nucleic Acid Atoms 0
Heterogen Atoms 10
Solvent Atoms 181

Software

Software
Software Name Purpose
SBC-Collect data collection
SHELXD phasing
MLPHARE phasing
DM model building
ARP model building
WARP model building
HKL-3000 phasing
PHENIX refinement version: (phenix.refine: 1.5_2)
HKL-3000 data reduction
HKL-3000 data scaling
DM phasing