X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion Sitting Drop
pH 7.5
Temperature 289.0
Details 0.005M CoCl2 hexahydrate, 0.005M NiCl2 hexahydrate, 0.005M CaCl2 dihydrate, 0.005M MgCl2 hexahydrate, 0.1M HEPES, 12% w/v PEG 3350, pH 7.5, VAPOR DIFFUSION, SITTING DROP, temperature 289K

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 126.39 α = 90
b = 126.39 β = 90
c = 88.98 γ = 120
Symmetry
Space Group H 3 2

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 100
Diffraction Detector
Detector Diffraction Type Details Collection Date
CCD ADSC QUANTUM 315r mirror 2009-08-11
Diffraction Radiation
Monochromator Protocol
Si 111 crystal SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 19-ID 0.97948 APS 19-ID

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.66 28.8 99.1 0.09 -- -- 7.3 32048 32048 0.0 0.0 --
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1.66 1.69 93.9 0.795 -- 1.75 6.9 --

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
SAD 1.659 28.732 -- 1.9 62026 62026 3159 98.72 -- 0.1843 0.1827 0.2131 --
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 1.6587 1.718 -- 310 5549 0.2914 0.3061 -- 92.0
X Ray Diffraction 1.718 1.7867 -- 305 5861 0.2692 0.3204 -- 99.0
X Ray Diffraction 1.7867 1.868 -- 307 5954 0.239 0.2699 -- 100.0
X Ray Diffraction 1.868 1.9665 -- 317 5976 0.2062 0.2475 -- 100.0
X Ray Diffraction 1.9665 2.0897 -- 343 5890 0.19 0.2334 -- 100.0
X Ray Diffraction 2.0897 2.251 -- 342 5959 0.1769 0.199 -- 100.0
X Ray Diffraction 2.251 2.4774 -- 302 5981 0.1734 0.2365 -- 100.0
X Ray Diffraction 2.4774 2.8356 -- 305 5959 0.1826 0.2286 -- 100.0
X Ray Diffraction 2.8356 3.5715 -- 341 5942 0.1783 0.2157 -- 100.0
X Ray Diffraction 3.5715 28.736 -- 287 5796 0.1587 0.166 -- 97.0
RMS Deviations
Key Refinement Restraint Deviation
f_angle_d 1.031
f_chiral_restr 0.066
f_bond_d 0.006
f_dihedral_angle_d 17.097
f_plane_restr 0.004
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 1855
Nucleic Acid Atoms 0
Heterogen Atoms 53
Solvent Atoms 163

Software

Software
Software Name Purpose
SBC-Collect data collection
SHELXD phasing
MLPHARE phasing
DM model building
ARP model building
WARP model building
HKL-3000 phasing
PHENIX refinement version: (phenix.refine: 1.5_2)
HKL-3000 data reduction
HKL-3000 data scaling
DM phasing