X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion Hanging Drop
pH 5.6
Temperature 298.0
Details 0.5M Ammonium Sulphate, 0.1M sodium citrate, 1.2M Lithium Sulfate, pH 5.6, VAPOR DIFFUSION, HANGING DROP, temperature 298K

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 59.03 α = 90
b = 63.31 β = 90
c = 83.34 γ = 90
Symmetry
Space Group P 21 21 21

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 100
Diffraction Detector
Detector Diffraction Type Details Collection Date
IMAGE PLATE RIGAKU RAXIS IV mirrors 2005-07-20
Diffraction Radiation
Monochromator Protocol
GRAPHITE SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
ROTATING ANODE RIGAKU MICROMAX-007 1.5418 -- --

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.6 63.29 92.74 -- 0.0764 -- 4.68 -- 38945 2.0 2.0 6.94
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1.6 1.71 65.44 -- -- -- 1.54 4841

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
MOLECULAR REPLACEMENT 1.6 43.176 -- 0.13 35784 35784 1835 84.86 0.1758 0.1758 0.1737 0.2147 random
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 1.5967 1.6398 -- 52 917 0.3195 0.3351 -- 30.0
X Ray Diffraction 1.6398 1.6881 -- 86 1767 0.2831 0.3251 -- 58.0
X Ray Diffraction 1.6881 1.7426 -- 136 2309 0.2408 0.3122 -- 76.0
X Ray Diffraction 1.7426 1.8049 -- 123 2536 0.1911 0.2561 -- 83.0
X Ray Diffraction 1.8049 1.8771 -- 148 2692 0.1543 0.219 -- 89.0
X Ray Diffraction 1.8771 1.9626 -- 154 2796 0.1304 0.1715 -- 92.0
X Ray Diffraction 1.9626 2.066 -- 164 2850 0.1345 0.1625 -- 94.0
X Ray Diffraction 2.066 2.1955 -- 141 2939 0.1432 0.1645 -- 95.0
X Ray Diffraction 2.1955 2.365 -- 159 2913 0.1553 0.2099 -- 95.0
X Ray Diffraction 2.365 2.6029 -- 160 2995 0.1596 0.2121 -- 97.0
X Ray Diffraction 2.6029 2.9795 -- 169 3030 0.1731 0.2175 -- 97.0
X Ray Diffraction 2.9795 3.7535 -- 172 3043 0.1665 0.188 -- 97.0
X Ray Diffraction 3.7535 43.192 -- 171 3162 0.188 0.2227 -- 96.0
Temperature Factor Modeling
Temperature Factor Value
Mean Isotropic B 12.388
Anisotropic B[1][1] 1.355
Anisotropic B[1][2] 0.0
Anisotropic B[1][3] 0.0
Anisotropic B[2][2] -0.691
Anisotropic B[2][3] 0.0
Anisotropic B[3][3] -2.483
RMS Deviations
Key Refinement Restraint Deviation
f_angle_d 1.11
f_dihedral_angle_d 15.228
f_plane_restr 0.004
f_bond_d 0.007
f_chiral_restr 0.08
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 2300
Nucleic Acid Atoms 0
Heterogen Atoms 5
Solvent Atoms 589

Software

Software
Software Name Purpose
HKL-2000 data collection
MOLREP phasing
PHENIX refinement version: (phenix.refine)
HKL-2000 data reduction
HKL-2000 data scaling