X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion Sitting Drop
pH 7.5
Temperature 291.0
Details 0.2 MgCl, 25% Peg3350, 0.1 M Hepes , pH 7.5, VAPOR DIFFUSION, SITTING DROP, temperature 291K

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 59.61 α = 90
b = 85.39 β = 90.78
c = 115.49 γ = 90
Symmetry
Space Group P 1 21 1

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 100
Diffraction Detector
Detector Diffraction Type Details Collection Date
CCD ADSC QUANTUM 315r mirrors 2009-06-03
Diffraction Radiation
Monochromator Protocol
double crystal MAD
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 19-ID 0.9794,0.9795 APS 19-ID

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.85 40 99.7 0.091 -- -- 3.4 98900 98606 2.0 2.0 28.2
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1.85 1.88 99.5 0.53 -- 2.0 3.4 4886

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
MAD 1.85 40.0 2.0 2.0 98246 93331 4915 99.26 0.168 0.16633 0.16347 0.21994 RANDOM
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 1.849 1.897 -- 397 6714 0.282 0.343 -- 97.44
Temperature Factor Modeling
Temperature Factor Value
Mean Isotropic B 9.062
Anisotropic B[1][1] 1.69
Anisotropic B[1][2] 0.0
Anisotropic B[1][3] 0.12
Anisotropic B[2][2] -1.06
Anisotropic B[2][3] 0.0
Anisotropic B[3][3] -0.63
RMS Deviations
Key Refinement Restraint Deviation
r_scbond_it 2.846
r_angle_refined_deg 1.623
r_dihedral_angle_4_deg 17.101
r_chiral_restr 0.101
r_gen_planes_refined 0.008
r_angle_other_deg 0.991
r_dihedral_angle_2_deg 34.005
r_dihedral_angle_1_deg 5.476
r_dihedral_angle_3_deg 13.748
r_mcangle_it 1.509
r_bond_refined_d 0.019
r_mcbond_other 0.303
r_bond_other_d 0.001
r_gen_planes_other 0.001
r_mcbond_it 0.902
r_scangle_it 4.272
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 8548
Nucleic Acid Atoms 0
Heterogen Atoms 9
Solvent Atoms 1525

Software

Software
Software Name Purpose
SBC-Collect data collection
HKL-3000 phasing
SHELX model building
MLPHARE phasing
Coot model building
ARP/wARP model building
REFMAC refinement version: 5.5.0102
HKL-3000 data reduction
HKL-3000 data scaling
SHELX phasing