X-RAY DIFFRACTION Experimental Data & Validation

X-ray Experimental Help

Crystallization

Crystalization Experiments
Temperature 293.0
Details 0.1M K Thiocyanate, 30% PEG2KMME, VAPOR DIFFUSION, SITTING DROP, temperature 293K

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 102.59 α = 90
b = 56.84 β = 90.01
c = 53.99 γ = 90
Symmetry
Space Group P 1 21 1

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 100
Diffraction Detector
Detector Diffraction Type Details Collection Date
CCD ADSC QUANTUM 315 MIRROR 2009-02-05
Diffraction Radiation
Monochromator Protocol
SI 111 CRYSTAL SAD
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 19-ID -- APS 19-ID

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.85 50 98.9 0.108 -- -- 3.0 -- 52443 -- 0.0 --
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1.85 1.88 97.9 0.807 -- 1.14 2.7 --

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
SAD 1.85 49.72 -- 1.89 100236 52354 5228 96.4 -- 0.21 0.207 0.257 --
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 1.85 1.8832 -- 265 3992 0.3557 0.3802 -- 98.0
X Ray Diffraction 1.8832 1.9175 -- 244 4723 0.3305 0.3563 -- 98.0
X Ray Diffraction 1.9175 1.9544 -- 267 4808 0.3309 0.3561 -- 98.0
X Ray Diffraction 1.9544 1.9942 -- 275 4861 0.3087 0.3279 -- 98.0
X Ray Diffraction 1.9942 2.0376 -- 244 4870 0.2898 0.3071 -- 98.0
X Ray Diffraction 2.0376 2.085 -- 230 4957 0.2935 0.31 -- 98.0
X Ray Diffraction 2.085 2.1371 -- 277 4866 0.286 0.2771 -- 98.0
X Ray Diffraction 2.1371 2.1949 -- 269 4888 0.2614 0.2899 -- 98.0
X Ray Diffraction 2.1949 2.2595 -- 224 4968 0.2535 0.2371 -- 98.0
X Ray Diffraction 2.2595 2.3325 -- 262 4833 0.25 0.2944 -- 98.0
X Ray Diffraction 2.3325 2.4158 -- 266 4852 0.2408 0.2469 -- 98.0
X Ray Diffraction 2.4158 2.5125 -- 226 4899 0.226 0.2837 -- 98.0
X Ray Diffraction 2.5125 2.6269 -- 259 4913 0.2243 0.3017 -- 98.0
X Ray Diffraction 2.6269 2.7654 -- 256 4813 0.2231 0.2741 -- 98.0
X Ray Diffraction 2.7654 2.9386 -- 270 4851 0.2052 0.2765 -- 98.0
X Ray Diffraction 2.9386 3.1655 -- 256 4783 0.1886 0.2573 -- 98.0
X Ray Diffraction 3.1655 3.4839 -- 263 4675 0.1697 0.2248 -- 98.0
X Ray Diffraction 3.4839 3.9879 -- 230 4562 0.1404 0.2125 -- 98.0
X Ray Diffraction 3.9879 5.0236 -- 265 4482 0.1414 0.1969 -- 98.0
X Ray Diffraction 5.0236 49.739 -- 241 4551 0.1991 0.2607 -- 98.0
Temperature Factor Modeling
Temperature Factor Value
Anisotropic B[1][1] -13.7152
Anisotropic B[1][2] 0.0
Anisotropic B[1][3] 1.1213
Anisotropic B[2][2] 9.1241
Anisotropic B[2][3] 0.0
Anisotropic B[3][3] 1.9468
RMS Deviations
Key Refinement Restraint Deviation
f_bond_d 0.006
f_angle_d 0.951
f_chiral_restr 0.067
f_plane_restr 0.003
f_dihedral_angle_d 18.665
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 4664
Nucleic Acid Atoms 0
Heterogen Atoms 72
Solvent Atoms 330

Software

Software
Software Name Purpose
SBC-Collect data collection
SHELXD phasing
MLPHARE phasing
DM model building
RESOLVE model building
HKL-3000 phasing
PHENIX refinement version: (phenix.refine)
HKL-3000 data reduction
HKL-3000 data scaling
DM phasing
RESOLVE phasing