X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion Hanging Drop
Details VAPOR DIFFUSION, HANGING DROP

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 55.18 α = 90
b = 116.57 β = 97.42
c = 55.19 γ = 90
Symmetry
Space Group P 1 21 1

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 103
Diffraction Detector
Detector Diffraction Type Details Collection Date
PIXEL PSI PILATUS 6M -- 2008-09-02
Diffraction Radiation
Monochromator Protocol
Si(111) SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON SLS BEAMLINE X06SA 1.0007 SLS X06SA

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.2 30 95.4 -- 0.043 -- 3.9 -- 33474 0.0 0.0 --
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
2.2 2.34 88.7 -- 0.11 -- -- --

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
MOLECULAR REPLACEMENT 2.2 19.983 -- 1.52 33474 33430 1741 95.45 0.1995 0.1995 0.1975 0.2367 random
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 2.2 2.2448 -- 79 1503 0.3067 0.3626 -- 98.0
X Ray Diffraction 2.2448 2.2936 -- 98 1872 0.298 0.3622 -- 98.0
X Ray Diffraction 2.2936 2.3469 -- 95 1796 0.278 0.3178 -- 98.0
X Ray Diffraction 2.3469 2.4055 -- 98 1860 0.2744 0.2939 -- 98.0
X Ray Diffraction 2.4055 2.4704 -- 99 1878 0.2698 0.2492 -- 98.0
X Ray Diffraction 2.4704 2.5429 -- 97 1858 0.2667 0.3195 -- 98.0
X Ray Diffraction 2.5429 2.6248 -- 100 1896 0.2709 0.3403 -- 98.0
X Ray Diffraction 2.6248 2.7184 -- 99 1884 0.2652 0.287 -- 98.0
X Ray Diffraction 2.7184 2.827 -- 100 1882 0.2665 0.3242 -- 98.0
X Ray Diffraction 2.827 2.9553 -- 100 1909 0.2394 0.3093 -- 98.0
X Ray Diffraction 2.9553 3.1105 -- 100 1906 0.2202 0.2635 -- 98.0
X Ray Diffraction 3.1105 3.3046 -- 101 1908 0.2089 0.2081 -- 98.0
X Ray Diffraction 3.3046 3.5584 -- 99 1896 0.1794 0.2111 -- 98.0
X Ray Diffraction 3.5584 3.9141 -- 102 1933 0.1563 0.1976 -- 98.0
X Ray Diffraction 3.9141 4.4749 -- 100 1895 0.1272 0.1919 -- 98.0
X Ray Diffraction 4.4749 5.6171 -- 103 1950 0.1341 0.1996 -- 98.0
X Ray Diffraction 5.6171 19.9836 -- 101 1933 0.1673 0.1663 -- 98.0
Temperature Factor Modeling
Temperature Factor Value
Anisotropic B[1][1] -3.1162
Anisotropic B[1][2] 0.0
Anisotropic B[1][3] 4.4999
Anisotropic B[2][2] 9.3349
Anisotropic B[2][3] 0.0
Anisotropic B[3][3] -6.5787
RMS Deviations
Key Refinement Restraint Deviation
f_bond_d 0.007
f_dihedral_angle_d 19.43
f_plane_restr 0.004
f_angle_d 1.08
f_chiral_restr 0.072
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 4664
Nucleic Acid Atoms 0
Heterogen Atoms 0
Solvent Atoms 149

Software

Software
Software Name Purpose
MAR345dtb data collection
PHASER phasing
PHENIX refinement version: (phenix.refine)
XDS data reduction
XDS data scaling