X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion Hanging Drop
pH 7
Temperature 293.0
Details 26% PEG1500, 0.1 M MMT pH 7.0, , VAPOR DIFFUSION, HANGING DROP, temperature 293K

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 40.29 α = 90
b = 54.57 β = 90
c = 103.1 γ = 90
Symmetry
Space Group P 21 21 21

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 100
Diffraction Detector
Detector Diffraction Type Details Collection Date
CCD ADSC QUANTUM 315 -- 2009-03-01
Diffraction Radiation
Monochromator Protocol
Cryo-Cooled Si(111) double crystal. SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 24-ID-C 0.97849 APS 24-ID-C

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.91 80 99.1 -- 0.073 -- 13.7 18085 18085 -- -3.0 --
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1.91 1.98 99.4 -- 0.472 6.1 13.9 --

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
SAD 1.91 51.57 -- 0.0 18226 17080 957 98.96 0.19814 0.19822 0.19603 0.2382 RANDOM
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 1.912 1.962 -- 66 1196 0.212 0.282 -- 96.7
Temperature Factor Modeling
Temperature Factor Value
Mean Isotropic B 12.911
Anisotropic B[1][1] -1.32
Anisotropic B[1][2] 0.0
Anisotropic B[1][3] 0.0
Anisotropic B[2][2] 1.45
Anisotropic B[2][3] 0.0
Anisotropic B[3][3] -0.13
RMS Deviations
Key Refinement Restraint Deviation
r_dihedral_angle_2_deg 41.942
r_bond_other_d 0.001
r_scbond_it 2.442
r_dihedral_angle_4_deg 9.701
r_bond_refined_d 0.011
r_angle_other_deg 0.877
r_dihedral_angle_1_deg 4.192
r_gen_planes_refined 0.004
r_chiral_restr 0.064
r_mcbond_it 0.702
r_angle_refined_deg 1.054
r_gen_planes_other 0.001
r_mcbond_other 0.169
r_scangle_it 3.848
r_mcangle_it 1.357
r_dihedral_angle_3_deg 14.344
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 1753
Nucleic Acid Atoms 0
Heterogen Atoms 6
Solvent Atoms 142

Software

Software
Software Name Purpose
HKL-2000 data collection
SOLVE phasing
REFMAC refinement version: 5.4.0061
DENZO data reduction
SCALEPACK data scaling