X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion Sitting Drop
pH 8.5
Temperature 295.0
Details 15-17% PEG 3350, 0.2M bis-tris-propane, 0.045M potassium thiocyanate, pH 8.5, VAPOR DIFFUSION, SITTING DROP, temperature 295.0K

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 119.93 α = 90
b = 119.93 β = 90
c = 347.67 γ = 120
Symmetry
Space Group P 65 2 2

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 100
Diffraction Detector
Detector Diffraction Type Details Collection Date
CCD MARMOSAIC 300 mm CCD -- 2008-11-02
Diffraction Radiation
Monochromator Protocol
-- SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 22-ID 1.0 APS 22-ID

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
3.26 50 94.7 0.089 -- -- 6.3 24802 23487 -- 2.0 --
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
3.26 3.46 85.9 0.48 -- 3.7 5.3 --

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
MOLECULAR REPLACEMENT 3.26 44.58 -- -- -- 21784 1703 97.8 -- 0.206 0.201 0.269 RANDOM
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 3.26 3.35 -- 111 1479 0.273 0.358 -- 90.5
Temperature Factor Modeling
Temperature Factor Value
Mean Isotropic B 78.38
Anisotropic B[1][1] -1.94
Anisotropic B[1][2] -0.97
Anisotropic B[1][3] 0.0
Anisotropic B[2][2] -1.94
Anisotropic B[2][3] 0.0
Anisotropic B[3][3] 2.92
RMS Deviations
Key Refinement Restraint Deviation
r_nbd_refined 0.304
r_mcangle_it 3.313
r_symmetry_hbond_refined 0.334
r_bond_refined_d 0.023
r_rigid_bond_restr 7.272
r_dihedral_angle_1_deg 8.208
r_dihedral_angle_3_deg 23.285
r_dihedral_angle_2_deg 38.578
r_nbtor_refined 0.344
r_scangle_it 6.601
r_sphericity_bonded 3.317
r_gen_planes_refined 0.006
r_angle_refined_deg 2.367
r_chiral_restr 0.149
r_sphericity_free 6.996
r_xyhbond_nbd_refined 0.2
r_scbond_it 6.577
r_symmetry_vdw_refined 0.243
r_mcbond_it 1.911
r_dihedral_angle_4_deg 21.122
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 5243
Nucleic Acid Atoms 0
Heterogen Atoms 95
Solvent Atoms 19

Software

Software
Software Name Purpose
XDS data scaling
PHASER phasing
REFMAC refinement version: 5.5.0066
XDS data reduction