X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion Hanging Drop
pH 5.6
Temperature 293.0
Details 18% PEG 4K, 13% ISOPROPANOL, 0.1 M NaCitrate, pH 5.6, VAPOR DIFFUSION, HANGING DROP, temperature 293K

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 51.09 α = 90
b = 114.3 β = 114.99
c = 52.32 γ = 90
Symmetry
Space Group P 1 21 1

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 100
Diffraction Detector
Detector Diffraction Type Details Collection Date
CCD MARMOSAIC 300 mm CCD -- 2008-02-16
Diffraction Radiation
Monochromator Protocol
Si(220) SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 22-ID 1.00000 APS 22-ID

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.37 30 94.3 0.038 -- -- 1.7 -- 113524 0.0 0.0 13.93
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1.37 1.42 89.3 0.241 -- 2.9 1.6 --

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
FOURIER SYNTHESIS 1.371 28.687 0.0 0.0 109022 109022 5438 95.93 0.1506 0.1506 0.1493 0.176 RANDOM
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 1.3706 1.3862 -- 145 3032 0.2061 0.2315 -- 83.0
X Ray Diffraction 1.3862 1.4025 -- 176 3314 0.185 0.1958 -- 94.0
X Ray Diffraction 1.4025 1.4196 -- 186 3487 0.1801 0.2058 -- 95.0
X Ray Diffraction 1.4196 1.4376 -- 178 3374 0.1702 0.1924 -- 95.0
X Ray Diffraction 1.4376 1.4565 -- 174 3469 0.1727 0.2178 -- 96.0
X Ray Diffraction 1.4565 1.4764 -- 160 3437 0.1618 0.2086 -- 96.0
X Ray Diffraction 1.4764 1.4975 -- 201 3456 0.1582 0.1857 -- 96.0
X Ray Diffraction 1.4975 1.5199 -- 179 3391 0.1467 0.2149 -- 96.0
X Ray Diffraction 1.5199 1.5436 -- 180 3498 0.139 0.1785 -- 96.0
X Ray Diffraction 1.5436 1.5689 -- 168 3425 0.1376 0.1665 -- 96.0
X Ray Diffraction 1.5689 1.596 -- 179 3514 0.1382 0.1667 -- 97.0
X Ray Diffraction 1.596 1.625 -- 172 3462 0.1313 0.1698 -- 97.0
X Ray Diffraction 1.625 1.6562 -- 172 3484 0.1331 0.1608 -- 97.0
X Ray Diffraction 1.6562 1.69 -- 196 3496 0.1371 0.1585 -- 97.0
X Ray Diffraction 1.69 1.7268 -- 159 3474 0.1359 0.1803 -- 97.0
X Ray Diffraction 1.7268 1.767 -- 190 3515 0.1373 0.1709 -- 97.0
X Ray Diffraction 1.767 1.8111 -- 184 3490 0.1397 0.1718 -- 97.0
X Ray Diffraction 1.8111 1.8601 -- 199 3510 0.1427 0.163 -- 98.0
X Ray Diffraction 1.8601 1.9148 -- 192 3495 0.1416 0.1747 -- 98.0
X Ray Diffraction 1.9148 1.9766 -- 190 3510 0.1375 0.1549 -- 98.0
X Ray Diffraction 1.9766 2.0472 -- 180 3534 0.1289 0.1525 -- 98.0
X Ray Diffraction 2.0472 2.1292 -- 188 3533 0.1284 0.153 -- 98.0
X Ray Diffraction 2.1292 2.226 -- 184 3522 0.1301 0.1535 -- 98.0
X Ray Diffraction 2.226 2.3434 -- 180 3499 0.1352 0.1736 -- 98.0
X Ray Diffraction 2.3434 2.4901 -- 211 3505 0.1421 0.1738 -- 97.0
X Ray Diffraction 2.4901 2.6822 -- 184 3479 0.1495 0.169 -- 97.0
X Ray Diffraction 2.6822 2.9519 -- 187 3479 0.1551 0.2037 -- 96.0
X Ray Diffraction 2.9519 3.3785 -- 195 3457 0.1439 0.1681 -- 96.0
X Ray Diffraction 3.3785 4.2543 -- 188 3428 0.1346 0.1587 -- 94.0
X Ray Diffraction 4.2543 28.6928 -- 161 3315 0.1478 0.1669 -- 90.0
Temperature Factor Modeling
Temperature Factor Value
Isotropic Thermal Model ISOTROPIC AND TLS
RMS Deviations
Key Refinement Restraint Deviation
f_bond_d 0.01
f_angle_d 1.138
f_plane_restr 0.006
f_chiral_restr 0.096
f_dihedral_angle_d 14.98
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 8858
Nucleic Acid Atoms 0
Heterogen Atoms 37
Solvent Atoms 694

Software

Software
Software Name Purpose
HKL-2000 data collection
PHENIX refinement version: (phenix.refine)
HKL-2000 data reduction
HKL-2000 data scaling